NF EN 60749-33 : 2005
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 33: ACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVE
12-01-2013
FOREWORD
1 Scope and object
2 Normative references
3 Test apparatus
4 General requirements
5 Test conditions
6 Procedure
7 Failure criteria
8 Safety
9 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
Publications
Evaluates the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments.
| DevelopmentNote |
Indice de classement: C96-022-33 (12/2005)
|
| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-33:2004-09 | Identical |
| BS EN 60749-33:2004 | Identical |
| UNE-EN 60749-33:2005 | Identical |
| IEC 60749-33:2004 | Identical |
| EN 60749-33:2004 | Identical |
| I.S. EN 60749-33:2004 | Identical |
| NF EN 60749-30 : 2005 AMD 1 2011 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING |
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