PNE-prEN 62374
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Published date
16-01-2008
Publisher
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| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62374:2007 | Identical |
| EN 62374:2007 | Identical |
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