SN EN 60749-5 : 2003
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 5: STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST
12-01-2013
Foreword
1 Scope
2 Normative references
3 General
4 Equipment
5 Test conditions
6 Procedures
7 Failure criteria
8 Safety
9 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
Publications
Covers a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
| DocumentType |
Standard
|
| PublisherName |
Swiss Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-5:2003-09 | Identical |
| NF EN 60749-5 : 2003 | Identical |
| I.S. EN 60749-5:2017 | Identical |
| EN 60749-5:2017 | Identical |
| BS EN 60749-5:2017 | Identical |
| UNE-EN 60749-5:2003 | Identical |
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