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BS EN 61747-10-2 - LIQUID CRYSTAL DISPLAY DEVICES - PART 10-2: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - ENVIRONMENTAL AND ENDURANCE

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Language(s): English

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Table of Contents - (Show below) - (Hide below)

FOREWORD
1 Scope and object
2 Normative references
3 Terms, definitions and symbols
4 Test methods
BIBLIOGRAPHY

BS EN 61747-10-2

Comment Closes On
Committee	EPL/47
Document Type	Draft
ISBN
Pages
Published
Publisher	British Standards Institution
Status	Current

IEC 60068-2-5:2010	Environmental testing - Part 2-5: Tests - Test Sa: Simulated solar radiation at ground level and guidance for solar radiation testing
IEC 60068-1:2013	Environmental testing - Part 1: General and guidance
IEC 60068-2-13:1983	Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
IEC 60747-5:1992	Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices
IEC 60068-2-38:2009	Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test
IEC 60068-2-3:1969	Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
IEC 60068-2-2:2007	Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV	Semiconductor devices - Mechanical and climatic test methods
IEC 60748-1:2002	Semiconductor devices - Integrated circuits - Part 1: General
IEC 60068-2-1:2007	Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 61747-5-3:2009	Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability
IEC 60068-2-14:2009	Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 60068-2-30:2005	Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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FOREWORD
1 Scope and object
2 Normative references
3 Terms, definitions and symbols
4 Test methods
BIBLIOGRAPHY

BS EN 61747-10-2

Comment Closes On
Committee	EPL/47
Document Type	Draft
ISBN
Pages
Published
Publisher	British Standards Institution
Status	Current

IEC 60068-2-5:2010	Environmental testing - Part 2-5: Tests - Test Sa: Simulated solar radiation at ground level and guidance for solar radiation testing
IEC 60068-1:2013	Environmental testing - Part 1: General and guidance
IEC 60068-2-13:1983	Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
IEC 60747-5:1992	Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices
IEC 60068-2-38:2009	Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test
IEC 60068-2-3:1969	Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
IEC 60068-2-2:2007	Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV	Semiconductor devices - Mechanical and climatic test methods
IEC 60748-1:2002	Semiconductor devices - Integrated circuits - Part 1: General
IEC 60068-2-1:2007	Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 61747-5-3:2009	Liquid crystal display devices - Part 5-3: Environmental, endurance and mechanical test methods - Glass strength and reliability
IEC 60068-2-14:2009	Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 60068-2-30:2005	Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)