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  • 13/30286159 DC : 0

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    BS EN 62435-1 - ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 1: GENERAL

    Available format(s):  Hardcopy, PDF

    Superseded date:  31-08-2017

    Language(s):  English

    Published date: 

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Purpose of Long-term storage
    5 Logistics
    6 Storage Considerations for Devices after Card (or
       Other) Attachment
    7 Handling
    8 Inspection
    9 Inventory Control Process
    10 Transportation
    11 Lead Finishes
    12 Kitting and Delivery Requirements
    13 Validation
    14 Unplanned Storage & types of storage
    15 In addition to the components, what else should be
       stored?
    16 Storage Facility
    17 Policies
    18 Legislation & Environmental Issues
    Annex A (informative) - Example of a component list
    Annex B (informative) - Examples of periodic and/or
            de-stocking tests
    Annex C (informative) - Parameters influencing the
            quantity of components to be stored

    General Product Information - (Show below) - (Hide below)

    Comment Closes On
    Committee EPL/47
    Document Type Draft
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    IEC 61340-5-1:2016 Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
    IEC TR 61340-5-2:2007 Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide
    IEC TR 62380:2004 Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    IEC TS 61945:2000 Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    EN 190000:1995 Generic Specification: Monolithic integrated circuits
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