• CLC/TR 62258-3:2007

    Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

    Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage

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    Withdrawn date:  28-09-2023

    Language(s): 

    Published date:  09-02-2007

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope and object
    2 Normative references
    3 Terms and definitions
    4 Handling - Good practice
       4.1 General
       4.2 Working environmental controls
       4.3 General handling precautions
       4.4 Cleanroom good practice
    5 Process handling issues
       5.1 Wafer sawing
       5.2 Die sorting
    6 Die and wafer transport and storage media
       6.1 Wafer carriers and cassettes
       6.2 In-process carriers and transport systems
       6.3 Packing for shipment of unsawn wafers
       6.4 Packing for shipment of sawn wafers
       6.5 Packing for shipment of single wafers
       6.6 Packing for shipment of die using trays
       6.7 Packing for shipment of die using tape-and-reel
       6.8 Secondary packing for shipment
    7 Storage good practice
       7.1 Die and wafer storage
       7.2 Short-term storage environment and conditions
       7.3 Storage time limitations
       7.4 Sawn wafer on wafer frame or ring
       7.5 Die products in the production area
       7.6 Die in tape-and-reel
       7.7 Dry-packed die products
    8 Traceability good practice
       8.1 General
       8.2 Wafer traceability
       8.3 Die products traceability
       8.4 Wafer and die back side marking
    9 Guidelines for long-term storage (die banking) of bare die
       and wafers
       9.1 General
       9.2 Preparing for storage
       9.3 Damage to die products during long-term storage
       9.4 Long-term storage environment
       9.5 Recommended inert atmosphere purity
       9.6 Chemical contamination
       9.7 Electrical effects
       9.8 Protection from radiation
       9.9 Periodic qualification of stored die products
    10 Good practice for automated handling during assembly
       10.1 Removal of die from shipping media
       10.2 Equipment out of service
    Annex A (informative) Planning checklist
    Annex B (informative) Material specifications
    Bibliography
    Annex ZA (normative) Normative references to international
                          publications with their corresponding
                          European publications

    General Product Information - (Show below) - (Hide below)

    Committee CLC/SR 47
    Development Note Supersedes ES 59008-4-2. (02/2007)
    Document Type Technical Report
    Publisher European Committee for Standards - Electrical
    Status Withdrawn
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    I.S. EN 62258-1:2010 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE
    EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
    EN 62258-1:2010 Semiconductor die products - Part 1: Procurement and use
    BS EN 62258-1:2010 Semiconductor die products Procurement and use
    BS EN 62435-5:2017 Electronic components. Long-term storage of electronic semiconductor devices Die and wafer devices
    CEI EN 62258-1 : 2011 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE

    Standards Referencing This Book - (Show below) - (Hide below)

    EN 61340-5-1:2016/AC:2017-05 ELECTROSTATICS - PART 5-1: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - GENERAL REQUIREMENTS (IEC 61340-5-1:2016/COR1:2017)
    IEC TS 61340-5-2:1999 Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide
    IEC 62258-1:2009 Semiconductor die products - Part 1: Procurement and use
    EN 62258-1:2010 Semiconductor die products - Part 1: Procurement and use
    EN 60286-3:2013/AC:2013 PACKAGING OF COMPONENTS FOR AUTOMATIC HANDLING - PART 3: PACKAGING OF SURFACE MOUNT COMPONENTS ON CONTINUOUS TAPES (IEC 60286-3:2013)
    IEC 62258-2:2011 Semiconductor die products - Part 2: Exchange data formats
    ISO 14644-1:2015 Cleanrooms and associated controlled environments Part 1: Classification of air cleanliness by particle concentration
    EN 61340-5-2:2001/corrigendum:2001 ELECTROSTATICS - PART 5-2: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - USER GUIDE
    IEC 60286-3:2013 Packaging of components for automatic handling - Part 3: Packaging of surface mount components on continuous tapes
    EN ISO 14644-1:2015 Cleanrooms and associated controlled environments - Part 1: Classification of air cleanliness by particle concentration (ISO 14644-1:2015)
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