ANSI/ESDA/JEDEC JS-002 : 2018
Current
Current
The latest, up-to-date edition.
ANSI/ESDA/JEDEC JOINT STANDARD FOR ELECTROSTATIC DISCHARGE SENSITIVITY TESTING – CHARGED DEVICE MODEL (CDM) – DEVICE LEVEL
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2019
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
| DocumentType |
Standard
|
| ISBN |
1-58537-298-6
|
| Pages |
45
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
| DSCC V62/22612:2022 | MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.