ANSI/ESDA/JEDEC JS-002 : 2018
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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ANSI/ESDA/JEDEC JOINT STANDARD FOR ELECTROSTATIC DISCHARGE SENSITIVITY TESTING – CHARGED DEVICE MODEL (CDM) – DEVICE LEVEL
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2019
Publisher
Superseded date
14-05-2025
Superseded by
Free
Excluding VAT
This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
| DocumentType |
Standard
|
| ISBN |
1-58537-298-6
|
| Pages |
45
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| DSCC V62/22612:2022 | MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON |
| JEDEC JESD82-531A:2024 | DDR5 Clock Driver Definition (DDR5CK01) |
| DSCC V62/P22612A:2022 | MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON |
| DSCC V62/22612A:2023 | MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON |
| JEDEC JESD82-513:2023 | DDR5 Registering Clock Driver Definition (DDR5RCD03) |
| DSCC V62/23623:2025 | MICROCIRCUIT, LINEAR, ENHANCED PRODUCT 2-V TO 5.5 V, LOW NOISE, HEX SCHMITTTRIGGER INVERTERS, MONOLITHIC SILICON |
| DSCC V62/23612:2023 | MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON |
| JEDEC JEP30-E100A:2023 | Part Model Electrical Guidelines for Electronic-Device Packages – XML Requirements |
| DSCC V62/24620:2024 | MICROCIRCUIT, DIGITAL, HEX INVERTER BUFFERS/DRIVERS WITH OPEN-DRAIN OUTPUTS, MONOLITHIC SILICON |
| JEDEC JESD 88F:2018 | JEDEC Dictionary of Terms for Solid- State Technology – 7th Edition |
| IEC 61340-5-1:2016 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements |
| JEDEC JESD 99C:2012 | Terms, Definitions, and Letter Symbols for Microelectronic Devices |
| JEDEC JESD 625B : 2012 | Requirements for Handling Electrostatic-Discharge-Sensitive (ESDS) Devices |
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