BS 2011(1967) : LATEST
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
Sorry this product is not available in your region.
| DocumentType |
Standard
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| Supersedes |
| BS CECC40301 001-004(1977) : 1977 | DETAIL SPECIFICATION FOR FIXED WIREWOUND INSULATED PRECISION RESISTORS - FULL ASSESSMENT LEVEL |
| BS QC 410400:1992 | Harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Sectional specification for rotary precision potentiometers |
| BS 5760-12:1993 | Reliability of systems, equipment and components Guide to the presentation of reliability, maintainability and availability predictions |
| BS QC 410300:1992 | Harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Sectional specification for single-turn rotary low-power wirewound and non-wirewound potentiometers |
| BS QC 300100:1991 | Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification: fixed polyethylene-terephthalate film dielectric metal foil d.c. capacitors |
| BS EN 135000:1993 | Harmonized system of quality assessment for electronic components. Generic specification: travelling wave amplifier tubes |
| BS EN 111000:1993 | Harmonized system of quality assessment for electronic components. Generic specification: cathode ray tubes |
| BS 6840-7(1996) : 1996 | SOUND SYSTEM EQUIPMENT - PART 7: HEADPHONES AND EARPHONES |
| BS 9125:1988 | Specification for capability approval of manufacturers of passive radio interference suppression filter units of assessed quality generic data |
| BS 9612 N018:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS CECC 41100:1978 | Harmonized system of quality assessment for electronic components: sectional specification: lead screw actuated and rotary preset potentiometers |
| DEFSTAN 00-035(PT3)/5(2017) : 2017 | ENVIRONMENTAL HANDBOOK FOR DEFENCE MATERIEL - PART 3: ENVIRONMENTAL TEST METHODS |
| BS CECC 00111-3:1991 | Rule of Procedure 11. Specifications Regulations for CECC Specifications for components for general and professional (civil and military) usage (excluding detail specifications) |
| BS EN 114000:1993 | Harmonized system of quality assessment for electronic components: generic specification: photomultiplier tubes |
| BS QC 300900:1991 | Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification: fixed polystyrene film dielectric metal foil d.c. capacitors |
| BS CECC 30600:1979 | Harmonized system of quality assessment for electronic components: sectional specification: fixed ceramic capacitors, type 1 |
| BS EN 123200:1992 | Harmonized system of quality assessment for electronic components: Sectional specification: Single and double sided printed boards with plated through holes |
| BS 5817-1:1980 | Specification for audiovisual, video and television equipment and systems General |
| BS 3382-1&2(1961) : 1961 | SPECIFICATION FOR ELECTROPLATED COATINGS ON THREADED COMPONENTS - CADMIUM ON STEEL COMPONENTS - ZINC ON STEEL COMPONENTS |
| DEFSTAN 66-21/1(1979) : 1979 | MULTIMETER SET |
| BS QC 410200:1992 | Harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Sectional specification for single-turn rotary power potentiometers |
| BS 613:1977 | Specification for components and filter units for electromagnetic interference suppression |
| BS 3382-3&4(1965) : 1965 | SPECIFICATION FOR ELECTROPLATED COATINGS ON THREADED COMPONENTS - NICKEL OR NICKEL PLUS CHROMIUM ON STEEL COMPONENTS - NICKEL OR NICKEL PLUS CHROMIUM ON COPPER AND COPPER ALLOY (INCLUDING BRASS) COMPONENTS |
| BS CECC 90000:1991 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
| BS CECC 23100-003:1996 | Harmonized system of quality assessment for electronic components. Capability detail specification: single and double sided printed boards with plain holes |
| BS CECC 90000:1985 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
| BS 9612 N016:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9612 N017:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 5787:1979 | Guide to the use of variable capacitors in electronic equipment |
| BS 7154:1989 | Specification for conference systems: electrical and audio requirements |
| BS 9070-1&2(1969) : 1969 AMD 7393 | SPECIFICATION FOR FIXED CAPACITORS OF ASSESSED QUALITY: GENERIC DATA AND METHODS OF TEST - PRINCIPLES AND MANDATORY PROCEDURES - GENERAL RULES FOR DRAFTING DETAIL SPECIFICATIONS |
| BS CECC 63200:1985 | Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits (capability approval) |
| BS 9133:1973 | Rules for the preparation of detail specifications for single turn low power rotary potentiometers of assessed quality |
| BS 9150:1983 | Specification for electrical relays of assessed quality: generic data and methods of test |
| BS 5704:1979 | Method for specifying the performance of digital electronic d.c. voltmeters and d.c. electronic analogue-to-digital convertors |
| BS 90:1975 | Specification for direct-acting electrical recording instruments and their accessories |
| BS 5817-20:1989 | Specification for audiovisual, video and television equipment and systems Methods of measuring and reporting the performance of 16 mm sound film projectors |
| BS CECC 30401 033:1981 | Harmonized detail specification for fixed metallized polyethylene terephthalate film dielectric d.c. capacitors (long-life grade). Rectangular insulated non-metallic case, rigid radial terminations. Full assessment level |
| DEFSTAN 66-31/2(1991) : 1991 | BASIC REQUIREMENTS AND TESTS FOR PROPRIETARY ELECTRONIC AND ELECTRICAL TEST EQUIPMENT |
| BS 4808-1:1972 | Specification for L.F. cables and wires with PVC insulation and PVC sheath for telecommunication General requirements and tests |
| BS CECC 46000:1978 | Harmonized system of quality assessment for electronic components: generic specification: cold cathode indicator tubes |
| BS EN 123400-800:1992 | Harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards without through-connections |
| BS 3382-5&6(1967) : 1967 | SPECIFICATION FOR ELECTROPLATED COATINGS ON THREADED COMPONENTS - TIN ON COPPER AND COPPER ALLOY (INCLUDING BRASS) COMPONENTS - SILVER ON COPPER AND COPPER ALLOY (INCLUDING BRASS) COMPONENTS |
| BS CECC 00017:1994 | Harmonized system of quality assessment for electronic components. Basic specification: microwave common modules for use up to 20 GHz. Interfaces, fixings, connection protocol and module coding |
| BS 6493-1.1:1984 | Semiconductor devices. Discrete devices General |
| BS 4054-1:1995 | Methods of measuring and expressing the performance of radio receivers for sound broadcasting General considerations and methods of measurement, including audio-frequency measurements |
| BS CECC 30500:1989 | Harmonized system of quality assessment for electronic components. Sectional specification: fixed metallized polycarbonate film dielectric capacitors for direct current |
| BS 9750:1990 | Specification for fixed radio frequency inductors of assessed quality: generic data and methods of test |
| BS 9753:1986 | Sectional specification for variable r.f. type inductors of assessed quality for use in electronic equipment for capability approval |
| BS 9120:1988 | Specification for radio interference suppression filters of assessed quality: generic data and methods of test |
| BS 9733:1985 | Sectional specification for pulse transformers of assessed quality for use in electronic equipment for capability approval |
| BS CECC 23200-003:1996 | Harmonized system of quality assessment for electronic components. Capability detail specification: single and double sided printed boards with plated through holes |
| BS 9720:1989 | Specification for custom-built transformers and inductors of assessed quality: generic data and methods of test |
| BS CECC 41000:1977 | Harmonized system of quality assessment for electronic components: generic specification for potentiometers |
| BS 9210:1984 | Specification for radio frequency connectors of assessed quality: generic data and methods of test |
| BS CECC 50000:1987 | Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices |
| BS 9741:1986 | Sectional specification for inductors of assessed quality for use in electronic equipment for capability approval |
| BS CECC 23300-003:1996 | Harmonized system of quality assessment for electronic components. Capability detail specification: multilayer printed boards |
| BS 9000-1:1989 | General requirements for a system for electronic components of assessed quality Specification of general procedures |
| BS 9727:1985 | Sectional specification for power transformers of assessed quality for use in electronic equipment for capability approval |
| BS 6221-1:1990 | Printed wiring boards Guide for the specification writer |
| BS 9210-N001.1(1975) : 1975 | DETAIL SPECIFICATION FOR RADIO FREQUENCY CONNECTORS (TYPE BNC) - SEALED, SOLDERED, CAPTIVE CONTACT, 50 OHMS - FULL ASSESSMENT LEVEL |
| BS CECC 123400-003:1994 | Specification for harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards without through-connections |
| BS EN 129100:1995 | Harmonized system of quality assessment for electronic components. Sectional specification: wirewound surface mounting inductors |
| BS 9612 N005:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS EN 60215:1996 | Safety requirements for radio transmitting equipment |
| BS 9040:1978 | Specification for gas-filled microwave switching tubes of assessed quality: generic data and methods of test |
| BS EN 123500:1992 | Specification for harmonized system of quality assessment for electronic components. Sectional specification: flexible printed boards with through connections |
| BS 9073 N0034:1978 | Detail specification for fixed tantalum electrolytic capacitors. Porous anode, polar non-solid electrolyte. Tubular insulated metallic case, PTFE/elastomer seal, axial wire terminations. Full plus additional assessment level |
| BS 9612 N007:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9612 N008:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| DEFSTAN 62-4/4(1992) : 1992 | LAMPS, NUCLEAR (GASEOUS TRITIUM LIGHT SOURCES) |
| BS 5164:1975 | Specification for indirect-acting electrical indicating and recording instruments and their accessories |
| BS EN 123100:1992 | Harmonized system of quality assessment for electronic components: Sectional specification: Single and double sided printed boards with plain holes |
| BS 5760-3:1982 | Reliability of systems, equipment and components Guide to reliability practices: examples |
| BS 6221-6:1982 | Printed wiring boards Specification for multilayer printed wiring boards |
| BS 9521:1983 | Specification for removable contacts of assessed quality for electrical connectors as defined by BS 9520: generic data, methods of test and rules for the preparation of detail specifications |
| BS EN 61071-2:1996 | Power electronic capacitors Requirements for disconnecting test on fuses, destruction test, self healing test and endurance test |
| BS CECC 00111-7:1994 | Rule of Procedure 11. Specifications Regulations for component specifications and assessment specifications |
| BS 6221-5:1982 | Printed wiring boards Specification for single and double sided rigid printed boards with plated-through holes |
| BS 9131 N001-016(1974) : 1974 AMD 4679 | |
| BS CECC 30201 001:1981 | Harmonized detail specification for fixed tantalum capacitors. Porous anode, solid electrolyte. Cylindrical insulated/non-insulated metallic case, polar/hermetic seal, axial terminations. Basic plus additional assessment level |
| BS EN 136000:1993 | Harmonized system of quality assessment for electronic components: generic specification: magnetrons |
| BS 9210-N007.1(1976) : 1976 | DETAIL SPECIFICATION FOR RADIO FREQUENCY CONNECTORS (TYPE SMB) - UNSEALED, SOLDERED, CAPTIVE CONTACT, 50 OHMS, SNAP-ON COUPLINGS - FULL ASSESSMENT LEVEL |
| BS 9400:1970 | Specification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test |
| BS 6840-1:1987 | Sound system equipment Methods for specifying and measuring general characteristics used for equipment performance |
| BS 9612 N020:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS CECC 00009:1982 | Harmonized system of quality assessment for electronic components. Basic specification: basic testing procedures and measuring methods for electromechanical components |
| BS 9300:1969 | Specification for semiconductor devices of assessed quality: generic data and methods of test |
| DEFSTAN 66-14/4(1993) : 1993 | INDICATORS, HUMIDITY, PLUG |
| IEC 60315-1:1988 | Methods of measurement on radio receivers for various classes of emission. Part 1: General considerations and methods of measurement, including audio-frequency measurements |
| BS 6221-4:1982 | Printed wiring boards Method for specifying single and double sided printed wiring boards with plain holes |
| BS 9563:1979 | Specification for rotary (manual) switches of assessed quality: generic data and methods of test; general rules for the preparation of detail specifications |
| BS 9520:1983 | Specification for electrical connectors of assessed quality for d.c. and low frequency application: generic data, methods of test and capability approval procedures |
| BS 9074 N007:1981 | Detail specification for polystyrene film dielectric capacitors, extended foil. Rectangular non-metallic case, unidirectional terminations. Full plus additional assessment level |
| BS 5817-17:1990 | Specification for audiovisual, video and television equipment and systems Methods for specifying and measuring the performance characteristics of audio-learning systems |
| BS CECC 63100:1985 | Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits |
| CECC 00017 : 1994 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BASIC SPECIFICATION: MICROWAVE COMMON MODULES FOR USE UP TO 20 GHZ - INTERFACES, FIXINGS, CONNECTION PROTOCOL AND MODULE CODING |
| BS 6221-7:1982 | Printed wiring boards Method for specifying single and double sided flexible printed wiring boards without through connections |
| BS EN 135001:1997 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW power amplifier travelling wave tubes up to 500 watts |
| BS EN 61187:1996 | Electrical and electronic measuring equipment. Documentation |
| BS 5760-10.2:1995 | Reliability of systems, equipment and components. Guide to reliability testing Design of test cycles |
| BS 9210 N0009-1:1978 | Detail specification for radio frequency connectors (series SMC) Unsealed, soldered, captive contact, 50 Ω, screw coupling - Full assessment level |
| DEFSTAN 66-9(PT1)/2(1983) : 1983 AMD 2 1987 | INSTRUMENTS, ELECTRICAL INDICATING (HERMETICALLY SEALED) 26 MM AND 38 MM - PART 1: SPECIFICATION |
| BS EN 140210:1995 | Harmonized system of quality assessment for electronic components. Sectional specification: fixed power resistors. Capability approval |
| BS EN 123500-800:1992 | Harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards with through-connections |
| BS 9076 N001-004(1974) : 1974 AMD 3815 | DETAIL SPECIFICATION FOR FIXED METALLIZED POLYETHYLENE TEREPHTHALATE (PETP) FILM OR METALLIZED POLYCARBONATE FILM DIELECTRIC CAPACITORS - RECTANGULAR NON-METALLIC CASE AXIAL OR RADIAL TERMINATIONS, CENTRALLY SPACED - FULL ASSESSMENT LEVEL |
| DEFSTAN 66-7(PT1)/3(1983) : 1983 AMD 1 1985 | INSTRUMENTS, ELECTRICAL INDICATING (SEALED) 50 MM TO 100 MM - PART 1: SPECIFICATION |
| DEFSTAN 61-12(PT33)/3(2000) : 2000 | WIRES, CORDS AND CABLES, ELECTRICAL PART 33: AIRFRAME WIRES AND CABLES IN THE TEMPERATURE CATEGORIES OF 135 DEGREE CENTIGRADE, 150 DEGREE CENTIGRADE, 200 DEGREE CENTIGRADE AND 260 DEGREE CENTIGRADE SECTIONAL SPECIFICATION |
| BS 9075 N023:1978 | Detail specification for fixed monolithic ceramic dielectric capacitors (type 1B). Rectangular non-metallic case, centred wires on one face. Full assessment level |
| BS 9130:1972 | Specification for potentiometers of assessed quality: generic data and methods of test |
| BS 9612 N006:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, 47 U/2, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS 9561:1979 | Specification for lever operated switches of assessed quality: generic data and methods of test; general rules for the preparation of detail specifications |
| BS 9100:1983 | Specification for capability approval for custom-built capacitors and capacitor modules: generic data and methods of test |
| DEFSTAN 00-035(PT2)/5(2017) : 2017 | ENVIRONMENTAL HANDBOOK FOR DEFENCE MATERIEL - PART 2: ENVIRONMENTAL TRIALS PROGRAMME DERIVATION AND ASSESSMENT METHODOLOGIES |
| BS 7515:1995 | Radiation protection instrumentation. Portable potential alpha energy meter for rapid measurements in mines |
| BS 6840-6:1987 | Sound system equipment Methods for specifying and measuring the characteristics of auxiliary passive elements |
| BS QC 390100:1992 | Harmonized system of quality assessment for electronic components. Fixed film resistor networks for use in electronic equipment. Sectional specification for film resistor networks of assessed quality on the basis of the capability approval procedure |
| BS CECC 40101 019:1977 | Detail specification for fixed low power non-wirewound insulated resistors. Metal oxide film, helically cut. Full assessment level |
| BS EN 61028:1993 | Specification for electrical measuring instruments. X-Y recorders |
| BS EN 123400:1992 | Harmonized system of quality assessment for electronic components. Sectional specification: flexible printed boards without through connections |
| BS 9721:1985 | Sectional specification for signal transformers of assessed quality for use in electronic equipment for capability approval |
| BS 9612 N019:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9074 N002:1974 | Detail specification for fixed polystyrene foil dielectric capacitors. Tubular insulated case, axial terminations. Full asessment level |
| BS 9564:1980 | Specification for push-button switches of assessed quality: generic data and methods of test; general rules for the preparation of detail specifications |
| BS 9450:1975 | Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test |
| BS QC 222100:1997 | Radio-frequency connectors. RF coaxial connectors with inner diameter of outer conductor 7 mm (0,276 in) with screw coupling. Characteristic impedance 50 ohms (75 ohms) (Type N) |
| BS QC 001002:1991 | Rules of procedure of the IEC quality assessment system for electronic components (IECQ) |
| BS 9133 N001-003(1975) : 1975 | DETAIL SPECIFICATION FOR SINGLE TURN LOW POWER NON-WIRE WOUND ROTARY POTENTIOMETERS - SPINDLE INSULATED FROM RESISTANCE ELEMENT, SPINDLE AND PANEL SEALED OR CONTAINER, SPINDLE AND PANEL SEALED - FULL ASSESSMENT LEVEL |
| BS QC 300600:1991 | Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed capacitors of ceramic dielectric, class 1 |
| BS CECC 123500-003:1994 | Specification for harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards with through-connections |
| BS 9612 N009:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS 9090:1977 | Variable capacitors of assessed quality: generic data and methods of test |
| BS 9612 N010:1979 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 6.0 to 25 MHz frequency range. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| BS EN 113000:1993 | Harmonized system of quality assessment for electronic components. Generic specification: camera tubes |
| BS 6221-8:1982 | Printed wiring boards Method for specifying single and double sided flexible printed wiring boards with through connections |
| BS 9075 N024:1978 | Detail specification for fixed monolithic ceramic dielectric capacitors (type 2C1). Rectangular non-metallic case, centred wires on one face. Full assessment level |
| BS 4054(1966) : 1966 | METHODS FOR MEASURING AND EXPRESSING THE PERFORMANCE OF RADIO RECEIVERS - RECEIVERS FOR A.M. AND F.M. SOUND BROADCAST TRANSMISSIONS |
| BS EN 190000:1996 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
| BS CECC 45000:1977 | Specification for harmonized system of quality assessment for electronic components: generic specification: space-charge controlled tubes |
| BS CECC 30401 023:1979 | Harmonized detail specification for fixed metallized polyethylene terephthalate film dielectric d.c. capacitors. Rectangular insulated non-metallic case, rigid radial terminations. Full assessment level |
| BS CECC 96000:1987 | Harmonized system of quality assessment for electronic components. Generic specification: electromechanical switches |
| BS 9074 N007:1978 | Detail specification for fixed polystyrene film dielectric extended foil capacitors. Rectangular non-metallic case, unidirectional terminations. Full plus additional assessment level |
| BS 6083-9:1986 | Hearing aids Methods for measurement of characteristics of hearing aids with bone vibrator output |
| BS 9612 N004:1977 | Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, 47 U/2, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level |
| DEFSTAN 62-9(PT1)/1(1974) : 1974 | LAMPHOLDERS; LIGHTS, INDICATOR; AND LENSES, INDICATOR LIGHT; FOR USE IN EQUIPMENTS - PART 1: GENERIC SPECIFICATION |
| BS 9612 N021:1979 | Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level |
| BS EN 123300:1992 | Specification for harmonized system of quality assessment for electronic components. Sectional specification. Multilayer printed boards |
| BS 5694:1979 | Method for measurement of non-linearity in resistors |
| EN 190000:1995 | Generic Specification: Monolithic integrated circuits |
| BS 2316-1&2(1968) : 1968 | SPECIFICATION FOR RADIO-FREQUENCY CABLES - GENERAL REQUIREMENTS AND TESTS - BRITISH GOVERNMENT SERVICES REQUIREMENTS |
| BS 3192(1996) : 1996 | SAFETY REQUIREMENTS FOR RADIO TRANSMITTING EQUIPMENT |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.