CECC 64000 : 1988
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GENERIC SPECIFICATION: FILM RESISTOR NETWORKS
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BS 5555:1993
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Specification for SI units and recommendations for the use of their multiples and of certain other units
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IEC 60147-1:1972
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Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics
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CECC 00109 : 1974
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CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS
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CECC 00107(PT3) : 80 AMD 1
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CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR CAPABILITY APPROVAL
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IEC 60191-1:2007
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Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
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IEC 60134:1961
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Rating systems for electronic tubes and valves and analogous semiconductor devices
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BS 2011-2.1B:1977
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Environmental testing. Tests Tests B. Dry Heat
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BS 9000-2(1996) : 1996
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GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM
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BS E9007:1975
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Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes
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CECC 00100 : 1988
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BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V
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BS 2011-2.1XA(1981) : 1981 AMD 7553
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ENVIRONMENTAL TESTING - TESTS - TEST XA AND GUIDANCE - IMMERSION IN CLEANING SOLVENTS
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IEC 60027-1:1992
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Letters symbols to be used in electrical technology - Part 1: General
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BS 2011-2.1N:1985
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Environmental testing. Tests Test N. Change of temperature
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BS 2011-2.1Ca:1977
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Environmental testing. Tests Test Ca. Damp heat, steady state
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CECC 00110 : 1994
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RULE OF PROCEDURE 10 - NATIONAL IMPLEMENTATION OF CECC PRODUCED EUROPEAN STANDARDS AND SPECIFICATIONS
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IEC 60410:1973
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Sampling plans and procedures for inspection by attributes
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BS 4727(1971) : LATEST
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CECC 00107(PT2) : 79 AMD 1
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CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR ENHANCED ASSESSMENT OF QUALITY
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IEC 60147-0B:1969
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Supplement B - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods - Part 0: General and terminology
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CECC 00107(PT1) : 1982
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CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - QUALITY ASSESSMENT PROCEDURE FOR GENERAL USAGE
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IEC TR 60440:1973
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Method of measurement of non-linearity in resistors
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CECC 00111 : 80 AMD 3
|
CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY
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BS 2011-2.1Ka:1982
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Environmental testing. Tests Test Ka.Salt mist
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IEC 60147-0:1966
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Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 0: General and terminology
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IEC 60148A:1974
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First supplement - Letter symbols for semiconductor devices and integrated microcircuits
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BS 3934:1965
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Specification for dimensions of semiconductor devices and integrated electronic circuits
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IEC 60148:1969
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Letter symbols for semiconductor devices and integrated microcircuits
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IEC 60147-0D:1974
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Supplement D - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods -Part 0: General and terminology
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CECC 00108 : 94 AC 98
|
RULE OF PROCEDURE 8 (ATTESTATION OF CONFORMITY) - PART 1: THE CECC MARK AND CONDITIONS OF USE - PART 2: CERTIFICATES OF APPROVAL - PART 3: PROCEDURES FOR THE ATTESTATION OF CONFORMITY
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BS 2011-3A & B:1977
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Environmental testing. Background information Tests A (cold) and tests B (dry heat)
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IEC 60191-3:1999
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Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
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BS 2011-2.1T:1981
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Environmental testing. Tests Test T. Soldering
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