BS CECC 90300:1988
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits
Hardcopy , PDF
English
30-06-1988
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Foreword
Preface
1 Scope
2 General
2.1 Related documents
2.2 Preferred voltages for interface monolithic
integrated circuits
2.3 Symbols and terminology
3 Quality assessment procedures
3.1 Structurally similar circuits
3.2 Certified test records
4 Test and measurement procedures
4.1 Electrical measurement procedures
4.1.1 Measuring methods common to digital circuits
4.1.2 Measuring methods common to analogue circuits
4.1.3 Specific methods for interface circuits
4.2 Endurance tests
4.2.1 General
4.2.2 Test conditions
5 Common blank detail specification for interface
monolithic integrated circuits
5.1 Introduction
5.2 Front page
5.3 Identification of the component and supplementary
information
5.4 Ratings (limited values) (not for inspection
purposes)
5.5 Recommended conditions for use and associated
characteristics (not for inspection purposes)
5.6 Supplementary information
5.7 Inspection requirements
5.7.1 Explanation of assessment quality levels P, Y and
L
5.7.2 Key of abbreviations
Group A inspection
Group B inspection
Group C inspection
Group D inspection
Annex
A Additional measuring methods
General details, quality assessment procedures, test and measurement procedures and a common blank detail specification.
| Committee |
EPL/47
|
| DevelopmentNote |
To be read in conjunction with BS CECC90000(1991) Supersedes BS CECC90300(1985) & 89/28882 DC (01/2006)
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| CECC 90300 : 1994 | Identical |
| BS CECC 90000:1991 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
| BS 6493-1.1:1984 | Semiconductor devices. Discrete devices General |
| BS 6493-2.1:1985 | Semiconductor devices. Integrated circuits General |
| IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
| BS 6493-2.2(1986) : 1986 | SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS |
| BS 9970-0:1985 | Harmonized system of quality assessment for electronic components. Semiconductor devices Generic specification |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60617-13:1993 | Graphical symbols for diagrams - Part 13: Analogue elements |
| IEC 60748-1:2002 | Semiconductor devices - Integrated circuits - Part 1: General |
| IEC 60748-2:1997 | Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits |
| IEC 60148:1969 | Letter symbols for semiconductor devices and integrated microcircuits |
| IEC 60748-3:1986 | Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits |
| IEC 60748-4:1997 | Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits |
| IEC 60617-12:1997 | Graphical symbols for diagrams - Part 12: Binary logic elements |
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