BS E9007:1975
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes
Hardcopy , PDF
04-11-2009
English
31-01-1975
Interprets BS 6001 (and IEC 60410) clauses as applied to specifications in harmonized system of quality assessment for electronic components.
Committee |
W/-
|
DevelopmentNote |
Also numbered as CECC 00007:1973 (01/2006) Reviewed and confirmed by BSI, January 2008. (12/2007)
|
DocumentType |
Standard
|
Pages |
8
|
PublisherName |
British Standards Institution
|
Status |
Withdrawn
|
Supersedes |
Standards | Relationship |
UNE-EN 62258-1:2005 | Identical |
BS EN 111000:1993 | Harmonized system of quality assessment for electronic components. Generic specification: cathode ray tubes |
BS EN 114000:1993 | Harmonized system of quality assessment for electronic components: generic specification: photomultiplier tubes |
BS CECC 30301 024:1981 | Harmonized detail specification for fixed aluminium electrolytic capacitors (long-life grade). Non-solid electrolyte. Cylindrical, polar insulated metallic case, clamp or stud mounting screw terminations. Full plus additional assessment level |
BS CECC 20000:1983 | Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices |
BS CECC 90000:1985 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
BS EN 135000:1993 | Harmonized system of quality assessment for electronic components. Generic specification: travelling wave amplifier tubes |
BS EN 175300:1997 | Harmonized system of quality assessment for electronic components. Sectional specification:rectangular connectors for frequencies below 3 MHz |
BS CECC 46000:1978 | Harmonized system of quality assessment for electronic components: generic specification: cold cathode indicator tubes |
BS CECC 63000:1990 | Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits |
BS CECC 41000:1977 | Harmonized system of quality assessment for electronic components: generic specification for potentiometers |
BS CECC 50000:1987 | Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices |
BS EN 112000:1997 | Harmonized system of quality assessment for electronic components. Generic specification: image converter and image intensifier tubes |
BS EN 136000:1993 | Harmonized system of quality assessment for electronic components: generic specification: magnetrons |
EN 112000:1992 | Generic Specification: Image converter and image intensifier tubes |
BS EN 125200:1993 | Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for linear transformers |
BS CECC 75100:1984 | Harmonized system of quality assessment for electronic components. Sectional specification: two-part and edge socket connectors for printed board application |
BS CECC 42000:1978 | Harmonized system of quality assessment for electronic components: generic specification: varistors |
BS EN 113000:1993 | Harmonized system of quality assessment for electronic components. Generic specification: camera tubes |
BS EN 190000:1996 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
BS CECC 45000:1977 | Specification for harmonized system of quality assessment for electronic components: generic specification: space-charge controlled tubes |
EN 190000:1995 | Generic Specification: Monolithic integrated circuits |
BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
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