BS EN 140000:1995
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Harmonized system of quality assessment for electronic components. Generic specification: fixed resistors
Hardcopy , PDF
01-04-2004
English
15-03-1995
Cooperating organizations
National foreword
Foreword
Section one. Scope
1. Scope
Section two. General
2. General
2.1 Related documents
2.2 Units, symbols and terminology
2.3 Preferred values
2.4 Marking
2.5 ESD sensitivity
Section three. Quality assessment procedures
3. Quality assessment procedures
3.1 General
3.2 Primary stage of manufacture
3.3 Subcontracting
3.4 Structurally similar components
3.5 Qualification approval procedures
3.6 Capability approval procedures
3.7 Rework and repair work
3.8 Release for delivery
3.9 Certified test records
3.10 Delayed delivery
3.11 Alternative test methods
3.12 Assessed process average procedures
3.13 Manufacture outside the geographical limits of CECC
supervising inspectorates
Section four. Test and measurement procedures
4. Test and measurement procedures
4.1 General
4.2 Standard atmospheric conditions
4.3 Drying
4.4 Visual examination and check of dimensions
4.5 Resistance
4.6 Insulation resistance
4.7 Voltage proof
4.8 Variation of resistance with temperature
4.9 Reactance
4.10 Non-linear properties
4.11 Voltage coefficient
4.12 Noise
4.13 Overload
4.14 Temperature rise
4.15 Robustness of the resistor body
4.16 Robustness of terminations
4.17 Solderability
4.18 Resistance to soldering heat
4.19 Rapid change of temperature
4.20 Bump
4.21 Shock
4.22 Vibration
4.23 Climatic sequence
4.24 Damp heat, steady state
4.25 Endurance
4.26 Accidental overload test (for lower power
non-wirewound resistors only)
4.27 Single-pulse high-voltage overload test
4.28 Periodic pulse high-voltage overload test
4.29 Component solvent resistance
4.30 Solvent resistance of marking
4.31 Shear test and substrate bending test (for surface
mounting resistors only)
4.32 Corrosion
4.33 Flammability
4.34 Seal test (Hermetically sealed resistors only)
Annexes
A. Example of a certified test record (RCE)
B. Internal visual examination of fixed resistors
C. External visual examination of fixed resistors
with enhanced assessment of quality
D. Radiographic inspection of fixed resistors
E. Blank detail specifications
National annex NA (informative) Committees responsible
National annex NB (informative) Cross-references
Relates to fixed discrete resistors with the exception of those whose prime usage requires that resistance is temperature or voltage dependent.
Committee |
W/-
|
DevelopmentNote |
Supersedes BS CECC 40000(1980) and 92/30898 DC. (04/2004)
|
DocumentType |
Standard
|
Pages |
60
|
PublisherName |
British Standards Institution
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
Standards | Relationship |
I.S. EN 140000:1994 | Identical |
DIN EN 140000:1994-10 | Identical |
NEN EN 140000 : 1997 | Identical |
EN 140000 : 1993 | Identical |
SN EN 140000 : 1992 | Identical |
BS EN 140210:1995 | Harmonized system of quality assessment for electronic components. Sectional specification: fixed power resistors. Capability approval |
BS EN 140103:1996 | Harmonized system of quality assessment for electronic components. Blank detail specification. Fixed low power non-wirewound resistors (Assessment level P) |
BS EN 140104:1996 | Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (Assessment levels SB and SC) |
BS 9450:1998 | Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test |
BS EN 140102:1996 | Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (assessment level M) |
BS EN 140211:1995 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors. Capability approval |
CECC 00109 : 1974 | CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
CECC 00006 : 1981 | BASIC SPECIFICATION: ENVIRONMENTAL TEST PROCEDURES |
IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
CECC 00100 : 1988 | BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V |
IEC 60068-2-11:1981 | Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist |
ISO 3:1973 | Preferred numbers Series of preferred numbers |
CECC 00015 : 91 ERRATA | BASIC SPECIFICATION - PROTECTION OF ELECTROSTATIC SENSITIVE DEVICES - GENERAL REQUIREMENTS |
CECC 00114 : 93 AMD 1 | QUALITY ASSESSMENT PROCEDURES - APPROVAL OF MANUFACTURERS AND OTHER ORGANIZATIONS |
IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
IEC 60294:2012 | Measurement of the dimensions of a cylindrical component with axial terminations |
IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC TR 60440:1973 | Method of measurement of non-linearity in resistors |
IEC 60062:2016 | Marking codes for resistors and capacitors |
IEC 60068-2-2a:1976 | Supplement A - Basic environmental testing procedures - Part 2: Tests - Tests B: Dry heat |
CECC 00111 : 80 AMD 3 | CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY |
IEC 60063:2015 | Preferred number series for resistors and capacitors |
ISO 497:1973 | Guide to the choice of series of preferred numbers and of series containing more rounded values of preferred numbers |
IEC 60068-2-29:1987 | Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
CECC 00007 : 1978 | BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES |
IEC 60068-2-1A:1976 | Supplement A - Basic environmental testing procedures - Part 2-1: Tests - Tests A: Cold |
IEC 60195:2016 | Method of measurement of current noise generated in fixed resistors |
IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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