BS EN 153000:1998
Current
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
15-07-1998
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.Applies to rectifier diodes, transistors, thyristors and their derivatives. The requirements also cover encapsulated assemblies but not to stacks or assemblies made with these encapsulated components.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 95/203864 DC (08/2004)
|
| DocumentType |
Standard
|
| Pages |
30
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| I.S. EN 153000:1998 | Identical |
| SN EN 153000 : 1998 | Identical |
| EN 153000:1998 | Identical |
| DIN EN 153000:1999-01 | Identical |
| NEN EN 153000 : 1998 | Identical |
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| EN 100114-1 : 1996 | RULE OF PROCEDURE - QUALITY ASSESSMENT PROCEDURES - PART 1: CECC REQUIREMENTS FOR THE APPROVAL OF AN ORGANIZATION |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| CECC 00111 : 80 AMD 3 | CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY |
| IEC 60148:1969 | Letter symbols for semiconductor devices and integrated microcircuits |
| IEC 60747-6:2016 | Semiconductor devices - Part 6: Discrete devices - Thyristors |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| CECC 00007 : 1978 | BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES |
| IEC 60747-2:2016 | Semiconductor devices - Part 2: Discrete devices - Rectifier diodes |
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