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    I.S. EN 153000:1998

    Current The latest, up-to-date edition.

    DISCRETE PRESSURE CONTACT POWER SEMICONDUCTOR DEVICES (QUALIFICATION APPROVAL) (GENERIC SPECIFICATION)

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-1998

    Publisher:  National Standards Authority of Ireland

    For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
    Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

    Dates of withdrawal of national standards are available from NSAI.

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    Table of Contents - (Show below) - (Hide below)

    1 General
    2 Quality assessment procedures
    3 Test and measurement procedures (general guidance)
    Annex A General inspection requirements for rectifier
            diodes and thyristors
    Annex B Additional electrical test methods
    Annex C Screening
    Annex D Dimensions
    Annex E Direction of applied forces for mechanical tests
    Figures

    Abstract - (Show below) - (Hide below)

    Applicable to discrete pressure contact power semiconductor devices known as rectifier diodes, transistors, thyristors and their derivatives. Also describes encapsulated assemblies. Not applicable to stacks or assemblies made from these encapsulated components.

    General Product Information - (Show below) - (Hide below)

    Document Type Standard
    Publisher National Standards Authority of Ireland
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    ISO 8601:2004 Data elements and interchange formats Information interchange Representation of dates and times
    EN 100114-1 : 1996 RULE OF PROCEDURE - QUALITY ASSESSMENT PROCEDURES - PART 1: CECC REQUIREMENTS FOR THE APPROVAL OF AN ORGANIZATION
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    CECC 00111 : 80 AMD 3 CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY
    ISO 2015:1976 Numbering of weeks
    ISO 497:1973 Guide to the choice of series of preferred numbers and of series containing more rounded values of preferred numbers
    IEC 60148:1969 Letter symbols for semiconductor devices and integrated microcircuits
    IEC 60747-6:2016 Semiconductor devices - Part 6: Discrete devices - Thyristors
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    CECC 00007 : 1978 BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES
    IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
    View more information

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