• BS EN 153000:1998

    Current The latest, up-to-date edition.

    Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  15-07-1998

    Publisher:  British Standards Institution

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    Abstract - (Show below) - (Hide below)

    Applies to rectifier diodes, transistors, thyristors and their derivatives. The requirements also cover encapsulated assemblies but not to stacks or assemblies made with these encapsulated components.

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    Committee EPL/47
    Development Note Supersedes 95/203864 DC (08/2004)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    EN 100114-1 : 1996 RULE OF PROCEDURE - QUALITY ASSESSMENT PROCEDURES - PART 1: CECC REQUIREMENTS FOR THE APPROVAL OF AN ORGANIZATION
    IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    CECC 00111 : 80 AMD 3 CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY
    IEC 60148:1969 Letter symbols for semiconductor devices and integrated microcircuits
    IEC 60747-6:2016 Semiconductor devices - Part 6: Discrete devices - Thyristors
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    CECC 00007 : 1978 BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES
    IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
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