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BS EN 167000:1993

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

View Superseded by

Harmonized system of quality assessment for electronic components. Generic specification: piezoelectric filters

Available format(s)

Hardcopy , PDF

Withdrawn date

27-10-2018

Superseded by

BS EN 60368-1:2000

Language(s)

English

Published date

15-08-1993

€217.36
Excluding VAT

Foreword
Section 1 - Scope
Section 2 - General
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Preferred ratings and characteristics
2.5 Marking
Section 3 - Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Subcontracting
3.4 Incorporated components
3.5 Manufacturer's approval
3.6 Approval procedures
3.7 Procedures for capability approval
3.8 Procedures for qualification approval
3.9 Test procedures
3.10 Screening requirements
3.11 Rework and repair work
3.12 Certified test records
3.13 Validity of release
3.14 Release for delivery
3.15 Unchecked parameters
Section 4 - Test and measurement procedures
4.1 General
4.2 Test and measurement conditions
4.2.1 Standard conditions for testing
4.2.2 Uncertainty of measurement
4.2.3 Precautions
4.2.4 Alternative test methods
4.3 Visual inspection
4.4 Dimensioning and gauging procedures
4.5 Electrical test procedures
4.5.1 General
4.5.2 Insertion attenuation
4.5.3 Insertion attenuation as a function of
        temperature
4.5.4 Insertion phase shift
4.5.5 Insertion phase shift as a function of
        temperature
4.5.6 Envelope delay time
4.5.7 Envelope delay time as a function of temperature
4.5.8 Return attenuation
4.5.9 Return attenuation as a function of temperature
4.5.10 Intermodulation distortion
4.6 Mechanical and environmental test procedures
4.6.1 Robustness of terminations
4.6.2 Sealing tests
4.6.3 Soldering (Solderability and resistance to
        solder heat)
4.6.4 Rapid change of temperature: severe shock by
        liquid immersion
4.6.5 Rapid change of temperature: with prescribed
        time of transition
4.6.6 Bump
4.6.7 Vibration
4.6.8 Shock
4.6.9 Free fall
4.6.10 Acceleration, steady state
4.6.11 Low air pressure
4.6.12 Dry heat
4.6.13 Damp heat, cyclic
4.6.14 Cold
4.6.15 Climatic sequence
4.6.16 Damp heat, steady state
4.6.17 Salt mist, cyclic
4.6.18 Immersion in cleaning solvents
4.6.19 Radiation hardness
4.7 Endurance test procedure
4.7.1 Ageing
National annex NA (informative) Committees responsible
National annex NB (informative) Cross-references

Specifies methods of test and general requirements for piezoelectric filters of assessed quality using either capability approval or qualification approval procedures.

Committee
W/-
DevelopmentNote
Supersedes 97/200499 DC (05/2005)
DocumentType
Standard
Pages
30
PublisherName
British Standards Institution
Status
Withdrawn
SupersededBy
Supersedes

CECC 00114-3 : 94 AMD 2 CAPABILITY APPROVAL OF AN ELECTRONIC COMPONENT MANUFACTURING ACTIVITY
CECC 00109 : 1974 CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
CECC 00802 : 1994 GUIDANCE DOCUMENT: CECC STANDARD METHOD FOR THE SPECIFICATION OF SURFACE MOUNTING (SMDs) OF ASSESSED QUALITY
IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
IEC 60368-1:2000+AMD1:2004 CSV Piezoelectric filters of assessed quality - Part 1: Genericspecification
IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
CECC 00114-2 : 1994 RULE OF PROCEDURE 14 - QUALITY ASSESSMENT PROCEDURES - PART 2: QUALIFICATION APPROVAL OF ELECTRONIC COMPONENTS
IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-10:2005 Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
CECC 00111 : 80 AMD 3 CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY
IEC 60050-561:2014 International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
IEC 60027-2:2005 Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics
IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
EN 168000 : 1993 AMD 2 1998 GENERIC SPECIFICATION - QUARTZ CRYSTAL UNITS
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 60068-2-52:2017 Environmental testing - Part 2-52: Tests - Test Kb: Salt mist, cyclic (sodium chloride solution)
IEC 60801-2:1991 Electromagnetic compatibility for industrial-process measurement and control equipment - Part 2: Electrostatic discharge requirements
IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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