BS EN 190100:1993
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits
Hardcopy , PDF
English
31-12-1986
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Foreword
Preface
1 Scope
2 General
2.1 Related documents
2.2 Preferred voltages for digital monolithic
integrated circuits
2.3 Symbols and terminology
3 Quality assessment procedures
3.1 Structurally similar circuits
3.2 Certified test records
4 Test and measurement procedures
4.1 Electrical measurement procedures
4.1.1 Verification of the function
4.1.2 Measurement of static characteristics
4.1.3 Measurement of dynamic characteristics
4.1.4 Output short-circuit current
4.1.5 Breakdown voltage
4.1.6 Power supply current
4.1.7 Capacitance
4.1.8 Leakage current
4.1.9 Transient energy rating
4.1.10 Input clamping voltage
4.2 Endurance tests
4.2.1 General
4.2.2 Test conditions
5 Common blank detail specification for digital
monolithic integrated circuits
5.1 Introduction
5.2 Front page
5.3 Identification of the component and
supplementary information
5.4 Inspection requirements
5.4.1 Explanation of assessment quality levels, P, Y
and L
5.4.2 Key of abbreviations
Group A inspection
Group B inspection
Group C inspection
Group D inspection
5.5 Requirements for sub-groups A3, A4 and A5
5.5.1 Requirements for TTL combinatorial circuits
5.5.2 Requirements for C.MOS circuits
Provides general details, quality assessment procedures, test and measurement procedures and a common blank detail specification.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes and renumbers BS CECC90100(1987) (07/2004)
|
| DocumentType |
Standard
|
| Pages |
60
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| DIN EN 190100:1995-02 | Identical |
| EN 190100:1993 | Identical |
| NEN EN 190100 : 2005 | Identical |
| BS EN 190116:1994 | Harmonized system of quality assessment for electronic components. Family specification: AC MOS digital integrated circuits |
| CECC 90000 : 90 AMD 1 | SPECIFICATION FOR HARMONIZED SYSTEMS OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION FOR MONOLITHIC INTEGRATED CIRCUITS |
| IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60748-1:2002 | Semiconductor devices - Integrated circuits - Part 1: General |
| IEC 60748-2:1997 | Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits |
| IEC 60148:1969 | Letter symbols for semiconductor devices and integrated microcircuits |
| IEC 60617-12:1997 | Graphical symbols for diagrams - Part 12: Binary logic elements |
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