BS EN 60068-2-82:2007

1 Scope
2 Normative references
3 Terms and definitions
4 Test equipment
  4.1 Desiccator
  4.2 Humidity chamber
  4.3 Thermal cycling chamber
  4.4 Optical microscope
  4.5 Scanning electron microscope microscopy
  4.6 Fixing jig
5 Preparation for test
  5.1 General
  5.2 Selection of test methods
  5.3 Storage conditions prior to testing
  5.4 Handling of the specimen
  5.5 Preconditioning by heat treatment
  5.6 Specimen preparation by leads forming
6 Test condition
  6.1 Ambient test
  6.2 Damp heat test
  6.3 Temperature cycling test
7 Test schedule
  7.1 Procedure for test method selection
  7.2 Initial measurement
  7.3 Test
  7.4 Recovery
  7.5 Intermediate or final assessment
8 Information to be given in the relevant specification
9 Minimum requirements for a test report
Annex A (normative) Measurement of the whisker length
Annex B (informative) Examples of whiskers
Annex C (informative) Guidance on the sample lots and test
                      schedules
Annex D (informative) Guidance on acceptance criteria
Annex E (informative) Background on whisker growth
Annex F (informative) Background on ambient test
Annex G (informative) Background on damp heat test
Annex H (informative) Background on temperature cycling test
Annex ZA (normative) Normative references to international
                      publications with their corresponding
                      European publications
Bibliography

Describes whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish.

IEC 60068-2-82:2007 specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish. However, the standard does not specify tests for whiskers that may grow as a result of external mechanical stress. This test method is employed by a relevant specification (international component or application specification) with transfer of the test severities to be applied and with defined acceptance criteria. Where tests described in this standard are considered for other components, e.g. mechanical parts as used in electrical or electronic equipment, it should be ensured that the material system and whisker growth mechanisms are comparable. The contents of the corrigendum of December 2009 have been included in this copy.