• BS EN 60068-2-82 : 2007

    Current The latest, up-to-date edition.

    ENVIRONMENTAL TESTING - PART 2-82: TESTS - TEST TX: WHISKER TEST METHODS FOR ELECTRONIC AND ELECTRIC COMPONENTS

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2007

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Test equipment
      4.1 Desiccator
      4.2 Humidity chamber
      4.3 Thermal cycling chamber
      4.4 Optical microscope
      4.5 Scanning electron microscope microscopy
      4.6 Fixing jig
    5 Preparation for test
      5.1 General
      5.2 Selection of test methods
      5.3 Storage conditions prior to testing
      5.4 Handling of the specimen
      5.5 Preconditioning by heat treatment
      5.6 Specimen preparation by leads forming
    6 Test condition
      6.1 Ambient test
      6.2 Damp heat test
      6.3 Temperature cycling test
    7 Test schedule
      7.1 Procedure for test method selection
      7.2 Initial measurement
      7.3 Test
      7.4 Recovery
      7.5 Intermediate or final assessment
    8 Information to be given in the relevant specification
    9 Minimum requirements for a test report
    Annex A (normative) Measurement of the whisker length
    Annex B (informative) Examples of whiskers
    Annex C (informative) Guidance on the sample lots and test
                          schedules
    Annex D (informative) Guidance on acceptance criteria
    Annex E (informative) Background on whisker growth
    Annex F (informative) Background on ambient test
    Annex G (informative) Background on damp heat test
    Annex H (informative) Background on temperature cycling test
    Annex ZA (normative) Normative references to international
                          publications with their corresponding
                          European publications
    Bibliography

    Abstract - (Show below) - (Hide below)

    Describes whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/501
    Development Note Supersedes 05/30133273 DC. (07/2007)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Superseded By
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61193-2:2007 Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages
    HD 323.2.20 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60068-2-58:2015+AMD1:2017 CSV Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    EN 60068-1:2014 ENVIRONMENTAL TESTING - PART 1: GENERAL AND GUIDANCE (IEC 60068-1:2013)
    EN 61760-1:2006 SURFACE MOUNTING TECHNOLOGY - PART 1: STANDARD METHOD FOR THE SPECIFICATION OF SURFACE MOUNTING COMPONENTS (SMDS)
    IEC 61760-1:2006 Surface mounting technology - Part 1: Standard method for the specification of surface mounting components (SMDs)
    EN 61192-3 : 2003 WORKMANSHIP REQUIREMENTS FOR SOLDERED ELECTRONIC ASSEMBLIES - PART 3: THROUGH-HOLE MOUNT ASSEMBLIES
    EN 60068-2-78:2013 ENVIRONMENTAL TESTING - PART 2-78: TESTS - TEST CAB: DAMP HEAT, STEADY STATE (IEC 60068-2-78:2012)
    IEC 60068-3-4:2001 ENVIRONMENTAL TESTING - PART 3-4: SUPPORTING DOCUMENTATION AND GUIDANCE - DAMP HEAT TESTS
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    EN 60068-2-14:2009 ENVIRONMENTAL TESTING - PART 2-14: TESTS - TEST N: CHANGE OF TEMPERATURE
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