BS EN 60747-16-3 : 2002
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - PART 16-3: MICROWAVE INTEGRATED CIRCUITS - FREQUENCY CONVERTERS
Hardcopy , PDF
English
01-01-2002
1 Scope
2 Normative references
3 terms and definitions
4 Abbreviated terms
5 Essential ratings and characteristics
5.1 General
5.2 Application description
5.3 Specification of the function
5.4 Limiting values (absolute maximum rating system)
5.5 Operating conditions (within the specified operating
temperature range)
5.6 Electrical characteristics
5.7 Mechanical and environmental ratings, characteristics
and data
5.8 Additional information
6 Measuring methods
6.1 General
6.2 Conversion gain (delta G[c])
6.3 Conversion gain flatness (G[c])
6.4 LO/IF isolation (P[LO]/P[LO(IF)])
6.5 LO/RF isolation (P[LO]/P[LO(RF)])
6.6 RF/IF isolation
6.7 Image rejection (P[o]/P[o(im)])
6.8 Sideband suppression (P[o]/P[o(U)])
6.9 Output power (P[o])
6.10 Output power at 1-dB conversion compression (P[o(1dB)])
6.11 Noise figure (F)
6.12 Intermodulation distortion (P[n]/P[1])
6.13 Output power at the intercept point (for intermodulation
products) (P[n(IP)])
6.14 LO port return loss (L[ret(LO)])
6.15 RF port return loss (L[ret(RF)])
6.16 IF port return loss (L[ret(IF)])
Gives new measuring methods, terminology and letter symbols, as well as essential ratings and characteristics for integrated circuit microwave frequency converters.
Committee |
EPL/47
|
DevelopmentNote |
Supersedes 00/203093 DC. (09/2002) 2002 Edition Re-Issued in October 2009 & incorporates AMD 1 2009. Supersedes 07/30169405 DC. (10/2009)
|
DocumentType |
Standard
|
Pages |
52
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
Standards | Relationship |
DIN EN 60747-16-3:2009-11 | Identical |
IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 CSV | Identical |
I.S. EN 60747-16-3:2002 | Identical |
EN 60747-16-3:2002/A2:2017 | Identical |
IEC 60050-702:1992 | International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices |
EN 61340-5-1:2016/AC:2017-05 | ELECTROSTATICS - PART 5-1: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - GENERAL REQUIREMENTS (IEC 61340-5-1:2016/COR1:2017) |
IEC 61340-5-1:2016 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements |
IEC TR 61340-5-2:2007 | Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide |
CLC/TR 61340-5-2:2008 | Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
EN 60747-16-1:2002/A2:2017 | SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS (IEC 60747-16-1:2001/A2:2017) |
IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 CSV | Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers |
IEC 60748-2:1997 | Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits |
IEC 60748-3:1986 | Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits |
IEC 60748-4:1997 | Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits |
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