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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD
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Published date: 12-01-2013
Publisher: Association Francaise de Normalisation
ForewordINTRODUCTION1 Scope2 Normative references3 Terms and definitions4 Test apparatus5 Procedure6 SummaryAnnex ZA (normative) Normative references to international publications with their corresponding European publications
Describes the rapid change of temperature test method and the two-fluid-bath method. It is applicable to all semiconductor devices.
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