BS EN 60749-25:2003
Current
The latest, up-to-date edition.
Semiconductor devices. Mechanical and climatic test methods Temperature cycling
Hardcopy , PDF
English
30-10-2003
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1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
5.1 Initial measurements
5.2 Conditioning
5.3 Cycle rates
5.4 Upper and lower soak times
5.5 Upper and lower soak temperatures
5.6 Soak modes
5.7 Cycle time
5.8 Ramp rate
5.9 Load transfer time
5.10 Recovery
5.11 Final measurements
5.12 Failure criteria
6 Summary
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 02/204668 DC. (11/2003) Supersedes BS EN 60749. (09/2005)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
Provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes. Permanent changes in electrical and/or physical characteristics can result from these mechanical stresses. Applies to single, dual and triple chamber temperature cycling and covers component and solder interconnection testing.
| Standards | Relationship |
| EN 60068-2-30:1999 | Identical |
| UNE-EN 60749-25:2004 | Identical |
| EN 60749-25:2003 | Identical |
| NF EN 60749-25 : 2003 | Identical |
| DIN EN 60749-25:2004-04 | Identical |
| SN EN 60749-25 : 2003 | Identical |
| NBN EN 60749-25 : 2004 | Identical |
| I.S. EN 60749-25:2003 | Identical |
| IEC 60749-25:2003 | Identical |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| EN 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
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