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BS EN 61837-3:2015

Current

Current

The latest, up-to-date edition.

Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-12-2015

€217.36
Excluding VAT

FOREWORD
1 Scope
2 Normative references
3 Configuration of enclosures
4 Designation of types
5 Metal enclosure dimensions
6 Lead connections
7 Designation of metal enclosures
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Defines the standard outlines and terminal lead connections as they apply to SMDs for frequency control and selection in metal enclosures and is based on IEC 61240 which standardized layout rules of outline drawings of the surface-mounted devices.

Committee
W/-
DevelopmentNote
Supersedes 97/230675 DC (05/2005) Supersedes 13/30278807 DC. (12/2015)
DocumentType
Standard
Pages
26
PublisherName
British Standards Institution
Status
Current
Supersedes

IEC 61837-3:2015 deals with standard outlines and terminal lead connections as they apply to SMDs for frequency control and selection in metal enclosures and is based on IEC 61240 which standardized layout rules of outline drawings of the surface-mounted devices. This edition includes the following significant technical changes with respect to the previous edition:
- The outline drawing is defined as one set of drawings consisting of four views, which are the view from above, the front view, the view from the right, and the view from below; the view from the right was drawn optionally in the previous edition.
- The height of package (G1) is eliminated, instead total height is expressed by the symbol letter G or with a subscript number.
- The dimensions of terminal lead spacing are shown by the centre position of the terminal leads and its basic value e is 2.54 x n mm (n is an integer) and 1,27 x n mm for package dimensions smaller than 6 mm (See IEC 61240:2012, 5.5). If the terminal lead spacing is not a multiple of the basic value, a subscript number such as e1, e2 is attached, e.g. e1, e2, etc. If there are plural spacing values, the subscript number is followed by a hyphen and numbers such as e1-1, e1-2 , etc.
- In terminal land areas, the lengths of each terminal pad are now expressed with maximum values for consumer\'s convenience. They were expressed as minimum values in the previous edition of IEC 61837-3.
- If there are plural identical enclosures with different height, each enclosure was expressed by a dash (/) and a two-digit number after the basic type name. The identity references are given in the table of the sheet.
- The configurations of the enclosures were revised as shown in Table 1.

This publication is to be read in conjunction with IEC 61240:2012.

Standards Relationship
DIN EN 61837-3:2016-04 Identical
I.S. EN 61837-3:2015 Identical
IEC 61837-3:2015 Identical
NBN EN 61837-3 : 2016 Identical
EN 61837-3:2015 Identical
NF EN 61837-3 : 2016 Identical

EN 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
EN 60368-2-2:1999 Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters
EN ISO 1101:2017 Geometrical product specifications (GPS) - Geometrical tolerancing - Tolerances of form, orientation, location and run-out (ISO 1101:2017)
IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
EN 61240:2017 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
ISO 1101:2017 Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out
IEC 60368-1:2000+AMD1:2004 CSV Piezoelectric filters of assessed quality - Part 1: Genericspecification
EN 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
IEC 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
IEC 61240:2016 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
IEC 60122-2:1983 Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection
IEC 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
IEC 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 60368-2-2:1996 Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters
EN 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
EN 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
IEC 60679-3:2012 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
IEC 60679-2:1981 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
EN 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
IEC 60368-2-1:1988 Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters
EN 60368-1:2000/A1:2004 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
EN 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

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