BS IEC 60747-1 : 2006
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - PART 1: GENERAL
Hardcopy , PDF
English
01-01-2006
Important note : Users cannot be edited or removed once added to your Multi user PDF.
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Letter symbols
5 Essential ratings and characteristics
6 Measuring methods
7 Acceptance and reliability of discrete devices
8 Electrostatic-sensitive devices
9 Product discontinuance notification
Annex A (informative) - Presentation of IEC 60747 and
IEC 60748
Annex B (informative) - Clause cross-references from the
first edition of IEC 60747-1(1983)
Bibliography
Provides the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes BS 6493-1.1(1984) and 04/30122195 DC. (07/2006) 2006 Edition Re-Issued in July 2010 & incorporates AMD 1 2010. Supersedes 09/30205407 DC. (07/2010)
|
| DocumentType |
Standard
|
| Pages |
46
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60747-1:2006+AMD1:2010 CSV | Identical |
| IEC 60050-131:2002 | International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory |
| IEC 60050-702:1992 | International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices |
| IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
| IEC 60319:1999 | Presentation and specification of reliability data for electronic components |
| IEC 60191-2:2012 DB | Mechanical standardization of semiconductor devices - Part 2: Dimensions |
| IEC 60469-1:1987 | Pulse techniques and apparatus. Part 1: Pulse terms and definitions |
| IEC 60749-26:2013 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
| ISO 9000:2015 | Quality management systems — Fundamentals and vocabulary |
| IEC 60050-521:2002 | International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.