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  • BS IEC 60747-1 : 2006

    Current The latest, up-to-date edition.

    SEMICONDUCTOR DEVICES - PART 1: GENERAL

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2006

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Letter symbols
    5 Essential ratings and characteristics
    6 Measuring methods
    7 Acceptance and reliability of discrete devices
    8 Electrostatic-sensitive devices
    9 Product discontinuance notification
    Annex A (informative) - Presentation of IEC 60747 and
            IEC 60748
    Annex B (informative) - Clause cross-references from the
            first edition of IEC 60747-1(1983)
    Bibliography

    Abstract - (Show below) - (Hide below)

    Provides the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Supersedes BS 6493-1.1(1984) and 04/30122195 DC. (07/2006) 2006 Edition Re-Issued in July 2010 & incorporates AMD 1 2010. Supersedes 09/30205407 DC. (07/2010)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60050-131:2002 International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory
    IEC 60050-702:1992 International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices
    IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices
    IEC 60319:1999 Presentation and specification of reliability data for electronic components
    IEC 60191-2:2012 DB Mechanical standardization of semiconductor devices - Part 2: Dimensions
    IEC 60469-1:1987 Pulse techniques and apparatus. Part 1: Pulse terms and definitions
    IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
    ISO 9000:2015 Quality management systems — Fundamentals and vocabulary
    IEC 60050-521:2002 International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
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