BS QC 760000:1990
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification
Hardcopy , PDF
English
30-04-1990
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National foreword
Committees responsible
Clause
SECTION 1 - SCOPE, OBJECT AND CLASSIFICATION
1.1 Scope
1.2 Object
1.3 Technological classification of F and HFICs
SECTION 2 - GENERAL
2.1 Order of precedence
2.2 Related documents
2.3 Units and symbols
2.4 Terminology
2.5 Standard and preferred values
2.6 Marking
SECTION 3 - QUALITY ASSESSMENT PROCEDURES
3.1 Primary stage of manufacture
3.2 Manufacturing stages and sub-contracting
3.3 Manufacturer approval
3.4 Approval of film integrated circuits and hybrid
film integrated circuits
3.5 Qualification approval
3.6 Capability approval
3.7 Certified records of released lots
3.8 Delayed deliveries
3.9 Delivery of F and HFICs subjected to destructive
or non-destructive tests
3.10 Supplementary procedure for deliveries
3.11 Supplementary information
SECTION 4 - TEST AND MEASUREMENT PROCEDURES
4.1 General
4.2 Standard conditions for testing
4.3 Visual examination
4.4 Electrical measurement procedures
4.5 Environmental testing procedures
Provides the quality assessment procedures and methods for electrical, climatic, mechanical and endurance tests, together with an outline of the requirements applicable to the release of film and hybrid film integrated circuits using either qualification or capability approval procedures.
| Committee |
EPL/47
|
| DevelopmentNote |
Also numbered as IEC 60748-20 Supersedes 85/22458 DC and 95/205099 DC (08/2005)
|
| DocumentType |
Standard
|
| Pages |
34
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| BS QC 760101:1997 | Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures |
| BS QC 760200:1997 | Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
| BS QC 760201:1997 | Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
| BS 2011-2.1B:1977 | Environmental testing. Tests Tests B. Dry Heat |
| BS 6458-2.2(1984) : 1984 | FIRE HAZARD TESTING FOR ELECTROTECHNICAL PRODUCTS - METHODS OF TEST - NEEDLE FLAME TEST |
| BS 6493-1.1:1984 | Semiconductor devices. Discrete devices General |
| BS 6001-1:1991 | Sampling procedures for inspection by attributes Specification for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection |
| BS 6493-2.1:1985 | Semiconductor devices. Integrated circuits General |
| BS 2011-2.1XA(1981) : 1981 AMD 7553 | ENVIRONMENTAL TESTING - TESTS - TEST XA AND GUIDANCE - IMMERSION IN CLEANING SOLVENTS |
| BS 2011-2.1N:1985 | Environmental testing. Tests Test N. Change of temperature |
| BS 2011-2.1Ca:1977 | Environmental testing. Tests Test Ca. Damp heat, steady state |
| BS 6493-3:1985 | Semiconductor devices Mechanical and climatic test methods |
| BS 5555:1981 | Specification for SI units and recommendations for the use of their multiples and of certain other units |
| BS 2011-2.1Ka:1982 | Environmental testing. Tests Test Ka.Salt mist |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
| BS 2011-3A & B:1977 | Environmental testing. Background information Tests A (cold) and tests B (dry heat) |
| BS 2011-2.1T:1981 | Environmental testing. Tests Test T. Soldering |
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