CEI EN 62215-3 : 2014
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF IMPULSE IMMUNITY - PART 3: NON-SYNCHRONOUS TRANSIENT INJECTION METHOD
Hardcopy , PDF
English
01-01-2014
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Coupling networks
6 IC configuration and evaluation
7 Test conditions
8 Test equipment
9 Test set up
10 Test procedure
11 Test report
Annex A (informative) - Test board recommendations
Annex B (informative) - Selection hints for coupling
and decoupling network values
Annex C (informative) - Industrial and consumer
applications
Annex D (informative) - Vehicle applications
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Describes a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances.
Committee |
CT 309
|
DevelopmentNote |
Classificazione CEI 47-117. (05/2014)
|
DocumentType |
Standard
|
Pages |
40
|
PublisherName |
Comitato Elettrotecnico Italiano
|
Status |
Current
|
Standards | Relationship |
EN 62215-3:2013 | Identical |
IEC 62215-3:2013 | Identical |
EN 62132-4:2006 | Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method |
IEC 62132-4:2006 | Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method |
ISO 7637-2:2011 | Road vehicles Electrical disturbances from conduction and coupling Part 2: Electrical transient conduction along supply lines only |
EN 61000-4-4:2012 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-4: TESTING AND MEASUREMENT TECHNIQUES - ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST (IEC 61000-4-4:2012) |
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