DD IEC/TS 62239:2003
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
View Superseded by
Process management for avionics. Preparation of an electronic components management plan
Hardcopy , PDF
27-10-2018
English
14-08-2003
Important note : Users cannot be edited or removed once added to your Multi user PDF.
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviations
4 Technical requirements
5 Plan administration requirements
Bibliography
Specifies the requirements for developing an Electronic Components Management Plan (ECMP) to assure customers and regulatory agencies that all of the electronic components in the equipment of the plan owner are selected and applied in controlled processes compatible with the end application and that the technical requirements detailed in Clause 4 are accomplished are accomplished.
| Committee |
GEL/107
|
| DevelopmentNote |
Supersedes 02/203838 DC. (08/2003)
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| SupersededBy | |
| Supersedes |
Defines the requirements for developing an electronic components management plan to assure customers and regulatory agencies that all of the electronic components in the equipment of the plan owner are selected and applied in controlled processes compatible with the end application and that the technical requirements are accomplished.
| Standards | Relationship |
| IEC TS 62239:2008 | Identical |
| DEFSTAN 02-250(PT0)/1(2013) : 2013 | MARITIME SUPPORT MANAGEMENT - PART 0: GENERAL INFORMATION FOR TYPE A AND TYPE B SUPPORT |
| DEFSTAN 02-606/2(2007) : 2007 | SELECTION OF TORSIONMETER SYSTEMS |
| DEFSTAN 02-250(PT0)/2(2015) : 2015 | MARITIME SUPPORT MANAGEMENT - PART 0: GENERAL INFORMATION FOR TYPE A AND TYPE B SUPPORT |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| IECQ 001003:1998 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - GUIDANCE DOCUMENTS |
| IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| IEC 61340-5-1:2016 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements |
| MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| ISO/TS 16949:2009 | Quality management systems Particular requirements for the application of ISO 9001:2008 for automotive production and relevant service part organizations |
| IECQ 001002-4:2008 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 4: AVIONICS ASSESSMENT PROGRAM REQUIREMENTS |
| IEC TR 61340-5-2:2007 | Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide |
| IECQ 01:2014 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ SYSTEM) - BASIC RULES |
| IECQ 001004:2006 | |
| ISO 9004:2009 | Managing for the sustained success of an organization A quality management approach |
| MIL-HDBK-263 Revision B:1994 | ELECTROSTATIC DISCHARGE CONTROL HANDBOOK FOR PROTECTION OF ELECTRICAL & ELECTRONIC PARTS, ASSEMBLIES & EQUIPMENT |
| IEC 62402:2007 | Obsolescence management - Application guide |
| ISO 9001:2015 | Quality management systems — Requirements |
| IEC 61967-6:2002+AMD1:2008 CSV | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method |
| ISO 9000:2015 | Quality management systems — Fundamentals and vocabulary |
| MIL-HDBK-512 Revision A:2001 | PARTS MANAGEMENT |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| AIAA R 100 : A 2001 | RECOMMENDED PRACTICE FOR PARTS MANAGEMENT |
| GEIA STD 0002-1 : 2005 | AEROSPACE QUALIFIED ELECTRONIC COMPONENT (AQEC) REQUIREMENTS, VOLUME 1 - INTEGRATED CIRCUITS AND SEMICONDUCTORS |
| IEC TR 62240:2005 | Process management for avionics - Use of semiconductor devices outside manufacturers' specified temperature range |
| EN 190000:1995 | Generic Specification: Monolithic integrated circuits |
| SAE AS 9000 : 1998 | AEROSPACE BASIC QUALITY SYSTEM STANDARD |
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