EN 13925-1:2003

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 General principles of X-ray powder diffraction (XRPD)
5 Meaning of the word "powder" in terms of X-ray diffraction
6 Characteristics of powder diffraction line profiles
7 Type of analysis
  7.1 General
  7.2 Phase identification (also referred to as "Qualitative
       phase analysis")
  7.3 Quantitative phase analysis
  7.4 Estimation of the crystalline and amorphous fractions
  7.5 Determination of lattice parameters
  7.6 Determination of crystal structures
  7.7 Refinement of crystal structures
  7.8 Characterisation of crystallographic texture
  7.9 Macrostress determination
  7.10 Analysis of crystalline size and microstrain
       7.10.1 General
       7.10.2 Determination of crystallite size (size of
              coherently scattering domains)
       7.10.3 Determination of microstrains
  7.11 Electron radial distribution function
8 Special experimental conditions
Annex A (informative) Relationships between the XRPD standards
Bibliography

This European Standard defines the general principles of X-ray diffraction from polycrystalline and amorphous materials. This materials testing method has traditionally been referred to as "X-ray Powder Diffraction (XRPD)", and is now applied to powders, bulk materials, thin film, and others. As the method can be used for various types of materials and to obtain a large variety of information, this standard reviews a large number of types of analysis but remains non-exhaustive.