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EN 60749-13:2002

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Superseded date

13-04-2018

Superseded by

EN IEC 60749-13:2018

Published date

16-08-2002

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Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.

Committee
CLC/SR 47
DevelopmentNote
Supersedes EN 60749. (06/2017) Redesignated as EN IEC 60749-13. (04/2018)
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Superseded
SupersededBy
Supersedes

IEC 60068-2-11:1981 Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist
EN 60068-2-11:1999 Environmental testing - Part 2: Tests - Test Ka: Salt mist
IEC 60749-14:2003 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

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