EN 60749-33:2004
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
16-04-2004
FOREWORD
1 Scope and object
2 Normative references
3 Test apparatus
4 General requirements
5 Test conditions
6 Procedure
7 Failure criteria
8 Safety
9 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
Publications
The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it.
| Committee |
CLC/TC 47X
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-33:2004-09 | Identical |
| UNE-EN 60749-33:2005 | Identical |
| NF EN 60749-33 : 2005 | Identical |
| NEN EN IEC 60749-33 : 2004 | Identical |
| PN EN 60749-33 : 2006 | Identical |
| BS EN 60749-33:2004 | Identical |
| CEI EN 60749-33 : 2012 | Identical |
| NBN EN 60749-33 : 2005 | Identical |
| I.S. EN 60749-33:2004 | Identical |
| IEC 60749-33:2004 | Identical |
| BS EN 60749-30 : 2005 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING |
| I.S. EN 60749-24:2004 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST |
| CEI EN 60749-24 : 2012 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST |
| EN 60749-30 : 2005 AMD 1 2011 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING |
| BS EN 60749-24:2004 | Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST |
| I.S. EN 60749-30:2005 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING |
| EN 60749-24:2004 | Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST |
| EN 60749-24:2004 | Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST |
| IEC 60749-24:2004 | Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST |
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