EN 61967-8 : 2011
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD
14-10-2011
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
6 Test equipment
7 Test set-up
8 Test procedure
9 Test report
10 IC Emissions reference levels
Annex A (normative) - IC stripline description
Annex B (informative) - Specification of emission
levels
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz.
| Committee |
SR 47A
|
| DevelopmentNote |
To be read in conjunction with EN 61967-1. (10/2011)
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Standards | Relationship |
| VDE 0847-21-8 : 2012 | Identical |
| NBN EN 61967-8 : 2011 | Identical |
| CEI EN 61967-8 : 2012 | Identical |
| NF EN 61967-8 : 2012 | Identical |
| BS EN 61967-8:2011 | Identical |
| I.S. EN 61967-8:2011 | Identical |
| DIN EN 61967-8 : 2012 | Identical |
| NEN EN IEC 61967-8 : 2011 | Identical |
| PN EN 61967-8 : 2012 | Identical |
| IEC 61967-8:2011 | Identical |
| UNE-EN 61967-8:2011 | Identical |
| PNE-FprEN 61967-8 | Identical |
| EN IEC 62969-1:2018 | Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors |
| IEC 61967-2:2005 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method |
| IEC 60050-131:2002 | International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory |
| IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| EN 61967-2:2005 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method |
| EN 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| IEC 61000-4-20:2010 | Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
| EN 61000-4-20:2010 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES |
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