I.S. CLC/TR 62258-3:2007
Current
The latest, up-to-date edition.
SEMICONDUCTOR DIE PRODUCTS - PART 3: RECOMMENDATIONS FOR GOOD PRACTICE IN HANDLING, PACKING AND STORAGE
Hardcopy , PDF
English
01-01-2007
FOREWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Terms and definitions
4 Handling - Good practice
4.1 General
4.2 Working environmental controls
4.3 General handling precautions
4.4 Cleanroom good practice
5 Process handling issues
5.1 Wafer sawing
5.2 Die sorting
6 Die and wafer transport and storage media
6.1 Wafer carriers and cassettes
6.2 In-process carriers and transport systems
6.3 Packing for shipment of unsawn wafers
6.4 Packing for shipment of sawn wafers
6.5 Packing for shipment of single wafers
6.6 Packing for shipment of die using trays
6.7 Packing for shipment of die using tape-and-reel
6.8 Secondary packing for shipment
7 Storage good practice
7.1 Die and wafer storage
7.2 Short-term storage environment and conditions
7.3 Storage time limitations
7.4 Sawn wafer on wafer frame or ring
7.5 Die products in the production area
7.6 Die in tape-and-reel
7.7 Dry-packed die products
8 Traceability good practice
8.1 General
8.2 Wafer traceability
8.3 Die products traceability
8.4 Wafer and die back side marking
9 Guidelines for long-term storage (die banking) of bare die
and wafers
9.1 General
9.2 Preparing for storage
9.3 Damage to die products during long-term storage
9.4 Long-term storage environment
9.5 Recommended inert atmosphere purity
9.6 Chemical contamination
9.7 Electrical effects
9.8 Protection from radiation
9.9 Periodic qualification of stored die products
10 Good practice for automated handling during assembly
10.1 Removal of die from shipping media
10.2 Equipment out of service
Annex A (informative) Planning checklist
Annex B (informative) Material specifications
Bibliography
Annex ZA (normative) Normative references to international
publications with their corresponding
European publications
Facilitates the production, supply and use of semiconductor die products, including: - wafers, - singulated bare die, - die and wafers with attached connection structures, and - minimally or partially encapsulated die and wafers.
DevelopmentNote |
Supersedes I.S. ES 59008-4-2. (03/2007)
|
DocumentType |
Standard
|
Pages |
56
|
PublisherName |
National Standards Authority of Ireland
|
Status |
Current
|
Standards | Relationship |
CLC/TR 62258-3:2007 | Identical |
IEC TR 62258-3:2010 | Identical |
EN 61340-5-1:2016/AC:2017-05 | ELECTROSTATICS - PART 5-1: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - GENERAL REQUIREMENTS (IEC 61340-5-1:2016/COR1:2017) |
IEC TS 61340-5-2:1999 | Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide |
IEC 62258-1:2009 | Semiconductor die products - Part 1: Procurement and use |
EN 62258-1:2010 | Semiconductor die products - Part 1: Procurement and use |
EN 60286-3:2013/AC:2013 | PACKAGING OF COMPONENTS FOR AUTOMATIC HANDLING - PART 3: PACKAGING OF SURFACE MOUNT COMPONENTS ON CONTINUOUS TAPES (IEC 60286-3:2013) |
IEC 62258-2:2011 | Semiconductor die products - Part 2: Exchange data formats |
ISO 14644-1:2015 | Cleanrooms and associated controlled environments Part 1: Classification of air cleanliness by particle concentration |
EN 61340-5-2:2001/corrigendum:2001 | ELECTROSTATICS - PART 5-2: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - USER GUIDE |
IEC 60286-3:2013 | Packaging of components for automatic handling - Part 3: Packaging of surface mount components on continuous tapes |
EN ISO 14644-1:2015 | Cleanrooms and associated controlled environments - Part 1: Classification of air cleanliness by particle concentration (ISO 14644-1:2015) |
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