I.S. EN 61000-4-1:2007
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-1: TESTING AND MEASUREMENT TECHNIQUES - OVERVIEW OF IEC 61000-4 SERIES
Hardcopy , PDF
13-05-2021
English
01-01-2007
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
INTRODUCTION
1 Scope and object
2 Normative references
3 Terms and definitions
4 General
5 Structure of the IEC 61000-4 series standards
6 Selection of tests
7 Test report
Annex ZA (normative) Normative references to international
publications with their corresponding
European publications
Presents applicability assistance to the technical committees of IEC or other bodies, users and manufacturers of electrical and electronic equipment on EMC standards within the IEC 61000-4 series on testing and measurement techniques and to provide general recommendations concerning the choice of relevant tests.
DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
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DocumentType |
Standard
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Pages |
48
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PublisherName |
National Standards Authority of Ireland
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Status |
Withdrawn
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Standards | Relationship |
NF EN 61000-4-1 : 2007 | Identical |
BS EN 61000-4-1:2007 | Identical |
IEC 61000-4-1:2006 | Identical |
UNE-EN 61000-4-1:2007 | Identical |
DIN EN 61000-4-1 : 2007 | Identical |
SN EN 61000-4-1 : 2000 | Identical |
EN 61000-4-1:2007 | Identical |
EN 61000-4-30:2015/AC:2017-01 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-30: TESTING AND MEASUREMENT TECHNIQUES - POWER QUALITY MEASUREMENT METHODS (IEC 61000-4-30:2015/COR1:2016) |
EN 61000-4-28:2000/A2:2009 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-28: TESTING AND MEASUREMENT TECHNIQUES - VARIATION OF POWER FREQUENCY, IMMUNITY TEST FOR EQUIPMENT WITH INPUT CURRENT NOT EXCEEDING 16 A PER PHASE |
EN 61000-4-21:2011 | Electromagnetic compatibility (EMC) - Part 4-21: Testing and measurement techniques - Reverberation chamber test methods |
IEC TR 61000-1-1:1992 | Electromagnetic compatibility (EMC) - Part 1: General - Section 1: Application and interpretation of fundamental definitions and terms |
EN 61000-4-11:2004/A1:2017 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-11: TESTING AND MEASUREMENT TECHNIQUES - VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS IMMUNITY TESTS (IEC 61000-4-11:2004/A1:2017) |
EN 61000-4-9:2016 | Electromagnetic compatibility (EMC) - Part 4-9: Testing and measurement techniques - Impulse magnetic field immunity test |
EN 61000-3-11:2000 | Electromagnetic compatibility (EMC) - Part 3-11: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems - Equipment with rated current |
IEC 61000-4-11:2004+AMD1:2017 CSV | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests |
EN 61000-3-3:2013 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 3-3: LIMITS - LIMITATION OF VOLTAGE CHANGES, VOLTAGE FLUCTUATIONS AND FLICKER IN PUBLIC LOW-VOLTAGE SUPPLY SYSTEMS, FOR EQUIPMENT WITH RATED CURRENT <= 16 A PER PHASE AND NOT SUBJECT TO CONDITIONAL CONNECTION (IEC 61000-3-3:2013) |
IEC 61000-4-25:2001+AMD1:2012 CSV | Electromagnetic compatibility (EMC) - Part 4-25: Testing and measurement techniques - HEMP immunity test methods for equipment and systems |
EN 61000-4-23:2000 | Electromagnetic compatibility (EMC) - Part 4-23: Testing and measurement techniques - Test methods for protective devices for HEMP and other radiated disturbances |
IEC 61000-4-8:2009 | Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test |
IEC 61000-3-12:2011 | Electromagnetic compatibility (EMC) - Part 3-12: Limits - Limits for harmonic currents produced by equipment connected to public low-voltage systems with input current >16 A and ≤ 75 A per phase |
EN 61000-4-14:1999/A2:2009 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-14: TESTING AND MEASUREMENT TECHNIQUES - VOLTAGE FLUCTUATION IMMUNITY TEST FOR EQUIPMENT WITH INPUT CURRENT NOT EXCEEDING 16 A PER PHASE |
IEC 61000-4-4:2012 RLV | Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test |
IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 CSV | Electromagnetic compatibility (EMC) - Part 4-17: Testing and measurement techniques - Ripple on d.c. input power port immunity test |
EN 61000-4-2:2009 | Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test |
EN 61000-4-7:2002/A1:2009 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-7: TESTING AND MEASUREMENT TECHNIQUES - GENERAL GUIDE ON HARMONICS AND INTERHARMONICS MEASUREMENTS AND INSTRUMENTATION, FOR POWER SUPPLY SYSTEMS AND EQUIPMENT CONNECTED THERETO (IEC 61000-4-7:2002/A1:2008) |
IEC 61000-4-33:2005 | Electromagnetic compatibility (EMC) - Part 4-33: Testing and measurement techniques - Measurement methods for high-power transient parameters |
IEC 61000-4-6:2013 | Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields |
EN 61000-4-3 : 2006 AMD 2 2010 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-3: TESTING AND MEASUREMENT TECHNIQUES - RADIATED, RADIO-FREQUENCY, ELECTROMAGNETIC FIELD IMMUNITY TEST |
IEC 61000-4-28:1999+AMD1:2001+AMD2:2009 CSV | Electromagnetic compatibility (EMC) - Part 4-28: Testing and measurement techniques - Variation of power frequency, immunity test for equipment with input current not exceeding 16 A per phase |
IEC 61000-4-24:2015 | Electromagnetic compatibility (EMC) - Part 4-24: Testing and measurement techniques - Test methods for protective devices for HEMP conducted disturbance |
IEC 61000-4-27:2000+AMD1:2009 CSV | Electromagnetic compatibility (EMC) - Part 4-27: Testing and measurement techniques - Unbalance, immunity test for equipment with input current not exceeding 16 A per phase |
EN 61000-4-8:2010 | Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test |
IEC 61000-4-15:2010 | Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications |
IEC 61000-4-20:2010 | Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
EN 61000-4-12:2017 | Electromagnetic compatibility (EMC) - Part 4-12: Testing and measurement techniques - Ring wave immunity test |
IEC 61000-4-2:2008 | Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test |
IEC 61000-4-3:2006+AMD1:2007+AMD2:2010 CSV | Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test |
IEC TS 61000-3-4:1998 | Electromagnetic compatibility (EMC) - Part 3-4: Limits - Limitation of emission of harmonic currents in low-voltage power supply systems for equipment with rated current greater than 16 A |
IEC 61000-3-3:2013 RLV | Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection |
EN 61000-3-2:2014 | Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current ≤ 16 A per phase) |
EN 61000-3-12:2011 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 3-12: LIMITS - LIMITS FOR HARMONIC CURRENTS PRODUCED BY EQUIPMENT CONNECTED TO PUBLIC LOW-VOLTAGE SYSTEMS WITH INPUT CURRENT > 16 A AND <= 75 A PER PHASE (IEC 61000-3-12:2011) |
IEC 61000-4-14:1999+AMD1:2001+AMD2:2009 CSV | Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase |
IEC 61000-4-7:2002+AMD1:2008 CSV | Electromagnetic compatibility (EMC) - Part 4-7: Testing and measurement techniques - General guide on harmonics and interharmonics measurements and instrumentation, for power supply systems and equipment connected thereto |
IEC TR 61000-4-32:2002 | Electromagnetic compatibility (EMC) - Part 4-32: Testing and measurement techniques - High-altitude electromagnetic pulse (HEMP) simulator compendium |
EN 61000-4-4:2012 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-4: TESTING AND MEASUREMENT TECHNIQUES - ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST (IEC 61000-4-4:2012) |
IEC 61000-4-23:2016 | Electromagnetic compatibility (EMC) - Part 4-23: Testing and measurement techniques - Test methods for protective devices for HEMP and other radiated disturbances |
EN 61000-4-24:1997 | Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 24: Test methods for protective devices for HEMP conducted disturbance |
EN 61000-4-16:2016 | Electromagnetic compatibility (EMC) - Part 4-16: Testing and measurement techniques - Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz |
EN 61000-4-27:2000/A1:2009 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-27: TESTING AND MEASUREMENT TECHNIQUES - UNBALANCE, IMMUNITY TEST FOR EQUIPMENT WITH INPUT CURRENT NOT EXCEEDING 16 A PER PHASE |
IEC 61000-4-29:2000 | Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests |
EN 61000-4-17:1999/A2:2009 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-17: TESTING AND MEASUREMENT TECHNIQUES - RIPPLE ON D.C. INPUT POWER PORT IMMUNITY TEST |
EN 61000-4-13:2002/A2:2016 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-13: TESTING AND MEASUREMENT TECHNIQUES - HARMONICS AND INTERHARMONICS INCLUDING MAINS SIGNALLING AT A.C. POWER PORT, LOW FREQUENCY IMMUNITY TESTS (IEC 61000-4-13:2002/A2:2015) |
IEC 61000-4-18:2006+AMD1:2010 CSV | Electromagnetic compatibility (EMC) - Part 4-18: Testing and measurement techniques - Damped oscillatory wave immunity test |
IEC 61000-4-21:2011 | Electromagnetic compatibility (EMC) - Part 4-21: Testing and measurement techniques - Reverberation chamber test methods |
IEC 61000-4-13:2002+AMD1:2009+AMD2:2015 CSV | Electromagnetic compatibility (EMC) - Part 4-13: Testing and measurement techniques - Harmonics and interharmonics includingmains signalling at a.c. power port, low frequency immunity tests |
EN 61000-4-15:2011 | Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications |
IEC 61000-4-34:2005+AMD1:2009 CSV | Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with mains current more than 16 A per phase |
EN 61000-4-20:2010 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES |
EN 61000-4-10:2017 | Electromagnetic compatibility (EMC) - Part 4-10: Testing and measurement techniques - Damped oscillatory magnetic field immunity test |
EN 61000-4-29:2000 | Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests |
EN 61000-4-25 : 2002 AMD 1 2012 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-25: TESTING AND MEASUREMENT TECHNIQUES - HEMP IMMUNITY TEST METHODS FOR EQUIPMENT AND SYSTEMS (IEC 61000-4-25:2001/A1:2012) |
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