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I.S. EN 61967-4:2002

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD

Available format(s)

Hardcopy , PDF

Superseded date

21-05-2021

Superseded by

I.S. EN IEC 61967-4:2021

Language(s)

English

Published date

01-01-2002

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


Dates of withdrawal of national standards are available from NSAI.

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National Foreword
FOREWORD
1 Scope
2 Normative references
3 Definitions
4 General
5 Test conditions
6 Test equipment
7 Test set-up
8 Test procedure
9 Test report
Annex A (normative) Probe calibration procedure
Annex B (informative) Classification of conducted
                       emission levels
Annex C (informative) Example of reference levels for
                       automotive applications
Annex D (informative) EMC requirements and how to use
                       EMC IC measurement techniques
Annex E (informative) Example of a test set-up consisting of
                       an EMC main test board and an EMC
                       IC test board
Annex F (informative) 150 ohms direct coupling networks for
        common mode emission measurements of differential
        mode data transfer ICs and similar circuits
Annex ZA (normative) Normative references to international
                       publications with their corresponding
                       European publications

Provides a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.

DevelopmentNote
AMD 1 2006 Re-issued on 02.03.2007 and incorporates corrigendum 2006. (03/2007) For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
146
PublisherName
National Standards Authority of Ireland
Status
Superseded
SupersededBy

EN 55016-1-4:2010/A2:2017 SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-4: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - ANTENNAS AND TEST SITES FOR RADIATED DISTURBANCE MEASUREMENTS (CISPR 16-1-4:2010/A2:2017)
IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
CISPR 16-1-4:2010+AMD1:2012+AMD2:2017 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-4: Radio disturbance and immunity measuring apparatus - Antennas and test sites for radiated disturbance measurements
CISPR 16-1-1:2015 Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-1: Radio disturbance and immunity measuring apparatus - Measuring apparatus
CISPR 16-1-3:2004+AMD1:2016 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-3: Radio disturbance and immunity measuring apparatus - Ancillary equipment - Disturbance power
CISPR 16-1-5:2014+AMD1:2016 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-5: Radio disturbance and immunity measuring apparatus - Antenna calibration sites and reference test sites for 5 MHz to 18 GHz
EN 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC 61000-4-6:2013 Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
EN 55016-1-5:2015/A1:2017 SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-5: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - ANTENNA CALIBRATION SITES AND REFERENCE TEST SITES FOR 5 MHZ TO 18 GHZ (CISPR 16-1-5:2014/A1:2016)
EN 55016-1-3:2006/A1:2016 SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-3: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - ANCILLARY EQUIPMENT - DISTURBANCE POWER (CISPR 16-1-3:2004)
EN 61000-4-6:2014/AC:2015 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS (IEC 61000-4-6:2013)
EN 55016-1-1:2010/A2:2014 SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS AND METHODS - PART 1-1: RADIO DISTURBANCE AND IMMUNITY MEASURING APPARATUS - MEASURING APPARATUS (CISPR 16-1-1:2010/A2:2014)

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