IEC 60444-2:1980
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Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English - French, Russian
Published date
01-01-1980
Publisher
Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.
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