IEC 60689:2008
Current
The latest, up-to-date edition.
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English, English - French
27-11-2008
Important note : Users cannot be edited or removed once added to your Multi user PDF.IEC 60689:2008 applies to measurements and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values for frequency control and selection. This edition includes the following significant technical changes with respect to the previous edition: a) The title of the first edition is Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values. The title is modified and the frequency range of this second edition is extended to the range from 10 kHz to 200 kHz. b) The Lissajous method is defined in the first edition as the standard measurement method. The PI network and bridge method are used in this second edition. c) The PI network has a transformer for impedance matching. This composition differs from that of IEC 60444-1.
| Committee |
TC 49
|
| DevelopmentNote |
A Bilingual edition has been published on 30/07/2013. (08/2013) Stability Date: 2017. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
19
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NF EN 60689 : 2014 | Identical |
| NEN EN IEC 60689 : 2009 | Identical |
| I.S. EN 60689:2009 | Identical |
| PN EN 60689 : 2009 | Identical |
| UNE-EN 60689:2009 | Identical |
| BS EN 60689:2009 | Identical |
| CEI EN 60689 : 2009 | Identical |
| EN 60689:2009 | Identical |
| DIN EN 60689:2009-08 | Identical |
| PNE-prEN 60689 | Identical |
| NEN 10689 : 1982 | Identical |
| EN IEC 63041-1:2018 | Piezoelectric sensors - Part 1: Generic specifications |
| I.S. EN IEC 63041-1:2018 | PIEZOELECTRIC SENSORS - PART 1: GENERIC SPECIFICATIONS |
| IEC 63041-1:2017 | Piezoelectric sensors - Part 1: Generic specifications |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
| IEC 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
| IECQ 001002-3:2005 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES |
| IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
| IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
| IEC 61178-3:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval |
| IECQ 001002-2:1998 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION |
| IEC 60068-2-31:2008 | Environmental testing - Part 2-31: Tests - Test Ec: Rough handling shocks, primarily for equipment-type specimens |
| IECQ 01:2014 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ SYSTEM) - BASIC RULES |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| IEC 60050-561:2014 | International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
| IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
| IEC 61178-2:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval |
| IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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