IEC 60747-16-2:2001+AMD1:2007 CSV
Current
The latest, up-to-date edition.
Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
22-01-2008
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Essential ratings and characteristics
4.1 General
4.2 Application-related description
4.3 Specification of the function
4.4 Limiting values (absolute maximum rating system)
4.5 Operating conditions (within the specified
operating temperature range)
4.6 Electrical characteristics
4.7 Mechanical and environmental ratings,
characteristics and data
4.8 Additional information
5 Measuring methods
5.1 General
5.2 Output power (P[o])
5.3 Output voltage (V[o])
5.4 Minimum operating input power (P[i, min])
5.5 Maximum operating input power (P[i, max])
5.6 Minimum operating input voltage (V[i, min])
5.7 Maximum operating input voltage (V[i, max])
5.8 Maximum input frequency (f[i, max])
5.9 Minimum input frequency (f[i, min])
5.10 High-level modulus control input voltage (V[CH])
5.11 Low-level modulus control input voltage (V[CL])
5.12 High-level modulus control input current (I[CH])
5.13 Low-level modulus control input current (I[CL])
Provides new measuring methods, terminology and letter symbols, as well as essential ratings and characteristics for integrated circuit microwave frequency prescalers. This consolidated version consists of the first edition (2001) and its amendment 1 (2007). Therefore, no need to order amendment in addition to this publication.
DevelopmentNote |
Stability Date: 2017. (10/2012)
|
DocumentType |
Standard
|
Pages |
30
|
PublisherName |
International Electrotechnical Committee
|
Status |
Current
|
Standards | Relationship |
DIN IEC 60747-16-2:2006-06 (Draft) | Identical |
NEN IEC 60747-16-2 : 2001 AMD 1 2008 | Identical |
BS IEC 60747-16.2 : 2001 | Identical |
BS EN 60747-16-10:2004 | Semiconductor devices Technology Approval Schedule (TAS) for monolithic microwave integrated circuits |
CEI EN 60747-16-10 : 2005 | SEMICONDUCTOR DEVICES - PART 16-10: TECHNOLOGY APPROVAL SCHEDULE (TAS) FOR MONOLITHIC MICROWAVE INTEGRATED CIRCUITS |
I.S. EN 60747-16-10:2004 | SEMICONDUCTOR DEVICES - PART 16-10: TECHNOLOGY APPROVAL SCHEDULE (TAS) FOR MONOLITHIC MICROWAVE INTEGRATED CIRCUITS |
BS EN 60747-16-1 : 2002 | SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS |
CEI EN 60747-16-1 : 2009 | SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS |
IEC 60747-16-10:2004 | Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits |
EN 60747-16-1:2002/A2:2017 | SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS (IEC 60747-16-1:2001/A2:2017) |
EN 60747-16-10:2004 | Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits |
IEC 61340-5-1:2016 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements |
IEC TR 61340-5-2:2007 | Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
IEC 60748-2:1997 | Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits |
IEC 60748-3:1986 | Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits |
IEC 60748-4:1997 | Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.