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IEC 61019-1-2:1993

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

02-11-2004

Superseded by

IEC 61019-1:2004

Language(s)

English - French

Published date

05-03-1993

€119.56
Excluding VAT

FOREWORD
Clause
1 General
   1.1 Scope and object
   1.2 Normative references
2 Standard conditions for testing
3 Visual examination and dimension control
4 Electric characteristics
   4.1 Measurement method of one-port resonator
   4.2 Measurement method of two-port resonator
5 Insulation resistance
6 Voltage proof
7 Sealing
   7.1 Test A
   7.2 Test B
8 Storage test
9 High temperature ageing
10 Strength of terminations
   10.1 Tensile test and thrust test
   10.2 Bend test
   10.3 Torque test
11 Solderability of terminations
   11.1 Solder bath method
   11.2 Soldering iron method
12 Rapid change of temperature
13 Bump
14 Vibration
15 Shock
16 Acceleration, steady state
17 Climatic test
   17.1 Dry heat
   17.2 Damp heat, cyclic
   17.3 Cold
18 Damp heat, steady state
19 Low air pressure
20 Mould growth
Annex A General recommendations for type approval test

Is applicable to test conditions for surface acoustic wave resonators and contains details of measurement methods and tests.

DocumentType
Standard
Pages
35
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
DIN IEC 61019-1-2:1994-01 Identical

03/108069 DC : DRAFT MAY 2003 IEC 62276 ED.1 - SINGLE CRYSTAL WAFERS APPLIED FOR SURFACE ACOUSTIC WAVE DEVICE - SPECIFICATION AND MEASURING METHOD
PD IEC/PAS 62276:2002 Single crystal wafers applied for surface acoustic wave device. Specification and measuring method
13/30278807 DC : 0 BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE
IEC PAS 62276:2001 Single crystal wafers applied for surface acoustic wave device - Specification and measuring method

IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
IEC 60368-1:2000+AMD1:2004 CSV Piezoelectric filters of assessed quality - Part 1: Genericspecification
IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-10:2005 Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth
IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 60444:1973 Basic method for the measurement of resonance frequency and equivalent series résistance of quartz crystal units by zero phase technique in a pi-network
IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 61019-1-1:1990 Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values
IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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