IEC 61019-1-2:1993
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
02-11-2004
English - French
05-03-1993
FOREWORD
Clause
1 General
1.1 Scope and object
1.2 Normative references
2 Standard conditions for testing
3 Visual examination and dimension control
4 Electric characteristics
4.1 Measurement method of one-port resonator
4.2 Measurement method of two-port resonator
5 Insulation resistance
6 Voltage proof
7 Sealing
7.1 Test A
7.2 Test B
8 Storage test
9 High temperature ageing
10 Strength of terminations
10.1 Tensile test and thrust test
10.2 Bend test
10.3 Torque test
11 Solderability of terminations
11.1 Solder bath method
11.2 Soldering iron method
12 Rapid change of temperature
13 Bump
14 Vibration
15 Shock
16 Acceleration, steady state
17 Climatic test
17.1 Dry heat
17.2 Damp heat, cyclic
17.3 Cold
18 Damp heat, steady state
19 Low air pressure
20 Mould growth
Annex A General recommendations for type approval test
Is applicable to test conditions for surface acoustic wave resonators and contains details of measurement methods and tests.
DocumentType |
Standard
|
Pages |
35
|
PublisherName |
International Electrotechnical Committee
|
Status |
Superseded
|
SupersededBy |
Standards | Relationship |
DIN IEC 61019-1-2:1994-01 | Identical |
03/108069 DC : DRAFT MAY 2003 | IEC 62276 ED.1 - SINGLE CRYSTAL WAFERS APPLIED FOR SURFACE ACOUSTIC WAVE DEVICE - SPECIFICATION AND MEASURING METHOD |
PD IEC/PAS 62276:2002 | Single crystal wafers applied for surface acoustic wave device. Specification and measuring method |
13/30278807 DC : 0 | BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE |
IEC PAS 62276:2001 | Single crystal wafers applied for surface acoustic wave device - Specification and measuring method |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
IEC 60368-1:2000+AMD1:2004 CSV | Piezoelectric filters of assessed quality - Part 1: Genericspecification |
IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
IEC 60068-2-10:2005 | Environmental testing - Part 2-10: Tests - Test J and guidance: Mould growth |
IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC 60444:1973 | Basic method for the measurement of resonance frequency and equivalent series résistance of quartz crystal units by zero phase technique in a pi-network |
IEC 60068-2-29:1987 | Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
IEC 61019-1-1:1990 | Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values |
IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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