IEC 61045-1:1991
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Fixed film resistor networks for use in electronic equipment - Part 1: Generic specification
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
08-10-2009
English - French
19-03-1991
Foreword
Preface
SECTION ONE - SCOPE
Clause
1 Scope
SECTION TWO - GENERAL
2 General
2.1 Related documents
2.2 Units, symbols and terminology
2.3 Preferred values
2.4 Marking
SECTION THREE - QUALITY ASSESSMENT PROCEDURES
3 Quality assessment procedures
3.1 Qualification Approval/Quality Assessment Systems
3.2 Primary Stage of Manufacture
3.3 Manufacturing stages in a Factory of an approved
manufacturer in a non-IECQ Member Country and
Sub-contracting
3.4 Manufacturer Approval
3.5 Approval procedures
3.6 Qualification Approval Procedures
3.7 Capability Approval Procedures
3.8 Quality Conformance Inspection
3.9 Alternative test methods
3.10 Unchecked parameters
SECTION FOUR - TEST AND MEASUREMENT PROCEDURES
4 Test and measurement procedures
4.1 General
4.2 Standard atmospheric conditions
4.3 Drying
4.4 Visual examination and check of dimensions
4.5 Resistance
4.6 Resistance ratio
4.7 Functional characteristics
4.8 Insulation resistance (insulated styles only)
4.9 Voltage proof (insulated networks only)
4.10 Variation of resistance with temperature
4.11 Non-linear properties
4.12 Overload
4.13 Robustness of terminations
4.14 Solderability
4.15 Resistance to soldering heat
4.16 Rapid change of temperature
4.17 Shock
4.18 Vibration
4.19 Climatic sequence
4.20 Damp heat, steady state
4.21 Endurance
4.22 Component solvent resistance
4.23 Solvent resistance of the marking
Appendix A: Interpretation of sampling plans and
procedures as described in IEC Publication
410 for use within the IEC Quality Assessment
System for Electronic Components
Appendix B: Rules for the preparation of detail
specification for capacitors and resistors for
electronic equipment
Establishes standard terms, inspection procedures and methods oftest for qualification and capability approval.
DevelopmentNote |
Also numbered as BS QC390000(1992) (08/2005)
|
DocumentType |
Standard
|
Pages |
89
|
PublisherName |
International Electrotechnical Committee
|
Status |
Superseded
|
SupersededBy |
Standards | Relationship |
SAC GB/T 15654 : 1995 | Identical |
NEN 11045-1 : 1991 | Identical |
NEN 11045-2 : 1991 | Identical |
BS QC 390101:1992 | Fixed film resistor networks for use in electronic equipment. Blank detail specification for film resistor networks of assessed quality on the basis of the capability approval procedure. Assessment level E |
IEC 61045-2:1991 | Fixed film resistor networks for use in electronic equipment - Part 2: Sectional specification for film resistor networks of assessed quality on the basis of the capability approval procedure |
BS QC 390100:1992 | Harmonized system of quality assessment for electronic components. Fixed film resistor networks for use in electronic equipment. Sectional specification for film resistor networks of assessed quality on the basis of the capability approval procedure |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
ISO 3:1973 | Preferred numbers Series of preferred numbers |
IEC 60027-1:1992 | Letters symbols to be used in electrical technology - Part 1: General |
IEC 60191-2:2012 DB | Mechanical standardization of semiconductor devices - Part 2: Dimensions |
IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
IEC 60068-2-3:1969 | Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state |
IEC 60294:2012 | Measurement of the dimensions of a cylindrical component with axial terminations |
IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC TR 60440:1973 | Method of measurement of non-linearity in resistors |
IEC 60062:2016 | Marking codes for resistors and capacitors |
IEC 60063:2015 | Preferred number series for resistors and capacitors |
ISO 497:1973 | Guide to the choice of series of preferred numbers and of series containing more rounded values of preferred numbers |
IEC 60717:2012 | Method for the determination of the space required by capacitors and resistors with unidirectional terminations |
IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
IEC 60195:2016 | Method of measurement of current noise generated in fixed resistors |
IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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