IEC 61967-8:2011
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
03-05-2023
English - French
11-08-2011
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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
6 Test equipment
7 Test set-up
8 Test procedure
9 Test report
10 IC Emissions reference levels
Annex A (normative) - IC stripline description
Annex B (informative) - Specification of emission levels
Bibliography
IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.
This publication is to be read in conjunction with IEC 61967-1:2002.
| Committee |
TC 47/SC 47A
|
| DevelopmentNote |
To be read in conjunction with IEC 61967-1. (08/2011) Stability Date: 2020 (09/2017)
|
| DocumentType |
Standard
|
| Pages |
34
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NF EN 61967-8 : 2012 | Identical |
| NEN EN IEC 61967-8 : 2011 | Identical |
| I.S. EN 61967-8:2011 | Identical |
| PN EN 61967-8 : 2012 | Identical |
| DIN EN 61967-8 : 2012 | Identical |
| VDE 0847-21-8 : 2012 | Identical |
| UNE-EN 61967-8:2011 | Identical |
| BS EN 61967-8:2011 | Identical |
| CEI EN 61967-8 : 2012 | Identical |
| EN 61967-8 : 2011 | Identical |
| BS IEC 61225:2019 | Identical |
| PNE-FprEN 61967-8 | Identical |
| EN IEC 62969-1:2018 | Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors |
| IEC 62969-1:2017 | Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors |
| 16/30336986 DC : 0 | BS EN 62969-1 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR INTERFACE FOR AUTOMOTIVE VEHICLES - PART 1: GENERAL REQUIREMENTS OF POWER INTERFACE FOR AUTOMOTIVE VEHICLE SENSORS |
| SAE ARP 6248 : 2016 | STRIPLINE TEST METHOD TO CHARACTERIZE THE SHIELDING EFFECTIVENESS OF CONDUCTIVE EMI GASKETS UP TO 40 GHZ |
| IEC 61967-2:2005 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method |
| IEC 60050-131:2002 | International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory |
| IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| IEC 61000-4-20:2010 | Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
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