IEC 62132-3:2007
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
31-12-2021
English - French
26-09-2007
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FOREWORD
1 Scope and object
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
5.1 General
5.2 Test equipment
5.3 Test board
6 Test procedure
6.1 Hazardous electromagnetic fields
6.2 Calibration of forward power limitation
6.3 BCI test
6.4 BCI test set-up characterization procedure
7 Test report
Annex A (informative) Examples for test levels and frequency
step selection
Annex B (informative) Example of BCI test board and set-up
Annex C (informative) Example of RF test board and set-up
Bibliography
This part of IEC 62132 describes a bulk current injection (BCI) test method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method only applies to ICs that have off-board wire connections e.g. into a cable harness. This test method is used to inject RF current on one or a combination of wires. This standard establishes a common base for the evaluation of semiconductor devices to be applied in equipment used in environments that are subject to unwanted radio frequency electromagnetic signals.
| DevelopmentNote |
Stability Date: 2015. (10/2012)
|
| DocumentType |
Standard
|
| Pages |
37
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Withdrawn
|
| Standards | Relationship |
| NEN EN IEC 62132-3 : 2007 | Identical |
| I.S. EN 62132-3:2007 | Identical |
| PN EN 62132-3 : 2007 | Identical |
| UNE-EN 62132-3:2007 | Identical |
| BS EN 62132-3:2007 | Identical |
| CEI EN 62132-3 : 2008 | Identical |
| EN 62132-3 : 2007 | Identical |
| NF EN 62132-3 : 2008 | Identical |
| DIN EN 62132-3:2008-04 | Identical |
| PNE-prEN 62132-3 | Identical |
| EN IEC 62969-1:2018 | Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors |
| BS EN 62132-1:2016 | Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions |
| I.S. EN 62132-1:2016 | INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 1: GENERAL CONDITIONS AND DEFINITIONS |
| IEC 62969-1:2017 | Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors |
| 12/30268333 DC : 0 | BS EN 62132-1 - INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 1: GENERAL CONDITIONS AND DEFINITIONS |
| IEC 62132-1:2015 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions |
| 16/30336986 DC : 0 | BS EN 62969-1 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR INTERFACE FOR AUTOMOTIVE VEHICLES - PART 1: GENERAL REQUIREMENTS OF POWER INTERFACE FOR AUTOMOTIVE VEHICLE SENSORS |
| EN 62132-1:2016 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions |
| ISO 11452-4:2011 | Road vehicles Component test methods for electrical disturbances from narrowband radiated electromagnetic energy Part 4: Harness excitation methods |
| IEC 62132-1:2015 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions |
| MIL-STD-461 Revision G:2015 | REQUIREMENTS FOR THE CONTROL OF ELECTROMAGNETIC INTERFERENCE CHARACTERISTICS OF SUBSYSTEMS AND EQUIPMENT |
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