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  • IEC PAS 62686-1:2011

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Process management for avionics - Aerospace qualified electronic components (AQEC) - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  18-09-2012

    Language(s):  English

    Published date:  21-04-2011

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Terms, definitions and abbreviations
    4 Abbreviations
    5 Technical requirements
    Annex A (normative) - STACK Specification
            S/0001 Issue 14

    Abstract - (Show below) - (Hide below)

    IEC/PAS 62686-1:2011(E) defines the minimum requirements for general purpose 'off the shelf' COTS integrated circuits and discrete semiconductors for high reliability applications. This PAS complements IEC/TS 62564-1. IEC/TS 62564-1 is to be used for high reliability applications where additional manufacturer's data is required beyond the publicly available manufacturer published datasheets. This PAS is to be used wherever possible for components that typically can be applied to operate in high reliability applications within the manufacturers publicly available datasheet limits. It is recommended that this PAS be used in conjunction with IEC/TS 62239 for avionics applications.

    General Product Information - (Show below) - (Hide below)

    Document Type Miscellaneous Product
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    DD IEC TS 62564-1 : DRAFT SEP 2011 PROCESS MANAGEMENT FOR AVIONICS - AEROSPACE QUALIFIED ELECTRONIC COMPONENTS (AQEC) - PART 1: INTEGRATED CIRCUITS AND DISCRETE SEMICONDUCTORS

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
    IEC 61340-5-1:2016 Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
    IEC TS 62239:2008 Process management for avionics - Preparation of an electronic components management plan
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
    EN 100015-3 : 1993 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: BASIC SPECIFICATION: REQUIREMENTS FOR CLEAN ROOM AREAS
    IPC J STD 004 : B REQUIREMENTS FOR SOLDERING FLUXES
    IPC J STD 033C-1:2014 HANDLING, PACKING, SHIPPING AND USE OF MOISTURE, REFLOW, AND PROCESS SENSITIVE DEVICES
    IEC TS 62564-1:2016 Process management for avionics - Aerospace qualified electronic components (AQEC) - Part 1: Integrated circuits and discrete semiconductors
    IPC J STD 035 : 0 ACOUSTIC MICROSCOPY FOR NON-HERMETIC ENCAPSULATED ELECTRONIC COMPONENTS
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