IEEE 1641.1-2013
Withdrawn
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IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
Hardcopy , PDF
21-03-2024
English
07-06-2013
1. Overview
2. Normative references
3. Definitions, acronyms, and abbreviations
4. Introduction to IEEE Std 1641
5. Describing signals using IEEE Std 1641
6. Signal models
7. Defining measurements with STD
8. Describing tests and test requirements
9. Basic signal components
10. Test signal framework
11. Digital signals
12. More about events and their interaction
13. Test Procedure Language
14. Signal Modeling Language
Annex A (informative) - Glossary
Annex B (informative) - Intrinsic measurement
Annex C (informative) - Generic measurement
Annex D (informative) - Role of Resource Adapter
Information (RAI) in IEEE Std 1641
Annex E (informative) - Understanding IEEE 1641
capabilities
Annex F (informative) - Implementation of IEEE 1641
application techniques
Annex G (informative) - Bibliography
Presents application information and guidance for users who write, develop, implement, and support test requirements, signal definitions, and signal responses using IEEE Std 1641-2010, the signal and test definition (STD) standard.
Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
DevelopmentNote |
Supersedes IEEE DRAFT 1641.1. (10/2007)
|
DocumentType |
Standard
|
ISBN |
978-0-7381-8367-1
|
Pages |
352
|
ProductNote |
NEW CHILD A 2018 IS ADDED
|
PublisherName |
Institute of Electrical & Electronics Engineers
|
Status |
Withdrawn
|
Supersedes |
DEFSTAN 66-031(PT8)/2(2016) : 2016 | REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE |
DEFSTAN 00-52/4(2014) : 2014 | THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES |
IEC 61671:2012 | Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
IEEE 1671.3-2007 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information |
BS IEC 61671:2012 | IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML |
IEEE 1641-2010 REDLINE | IEEE Standard for Signal and Test Definition |
IEEE 1671.6-2015 | IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description |
IEEE 260.1 : 2004 | LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS) |
IEEE/ASTM SI_10-2010 | American National Standard for Metric Practice |
IEEE 1671.2-2012 | IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description |
IEEE 1671.1-2009 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions |
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