IEEE 1671.2-2012
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
PDF , Hardcopy
30-03-2023
English
15-02-2013
Important note : Users cannot be edited or removed once added to your Multi user PDF.
1 Overview
2 Normative references
3 Definitions, abbreviations, and acronyms
4 InstrumentDescription schema
5 InstrumentDescription instance schema
6 ATML InstrumentDescription XML schema names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download Web site material
associated with this document
Annex B (informative) - Users information and examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography
This standard defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance information.
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DevelopmentNote |
Also numbered as IEC 61671-2. (04/2016)
|
| DocumentType |
Standard
|
| ISBN |
978-0-7381-8144-8
|
| Pages |
52
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Withdrawn
|
| Supersedes |
| DEFSTAN 66-031(PT8)/2(2016) : 2016 | REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE |
| DEFSTAN 00-52/4(2014) : 2014 | THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES |
| IEC 61671:2012 | Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
| BS IEC 61671:2012 | IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML |
| IEEE 1871.1-2014 | IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters |
| IEEE 1641.1-2013 | IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition |
| IEEE 1057-2007 REDLINE | IEEE Standard for Digitizing Waveform Recorders |
| IEEE 1155 : 1992 | VMEBUS EXTENSIONS FOR INSTRUMENTATION: VXIBUS |
| TIA 232 : F1997(R2012) | INTERFACE BETWEEN DATA TERMINAL EQUIPMENT AND DATA CIRCUIT-TERMINATING EQUIPMENT EMPLOYING SERIAL BINARY DATA INTERCHANGE |
| IEC 60488-2:2004 | Standard digital interface for programmable instrumentation - Part 2: Codes, formats, protocols and common commands |
| IEEE 802.3-2012 | IEEE Standard for Ethernet |
| IEEE 1671.6-2015 | IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description |
| IEEE 260.1 : 2004 | LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS) |
| IEEE 1671-2010 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
| MIL-PRF-55310 Revision E:2006 | OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR |
| MIL-STD-1309 Revision D:1992 | DEFINITIONS OF TERMS FOR TEST, MEASUREMENT AND DIAGNOSTIC EQUIPMENT |
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