ISO 23833:2013
Current
Current
The latest, up-to-date edition.
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
Available format(s)
Hardcopy , PDF
Language(s)
French, English
Published date
05-04-2013
€41.00
Excluding VAT
ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.
ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.
| Committee |
ISO/TC 202/SC 1
|
| DevelopmentNote |
Supersedes ISO/DIS 23833. (04/2013)
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NEN ISO 23833 : 2013 | Identical |
| BS ISO 23833:2013 | Identical |
| NF ISO 23833 : 2008 | Identical |
| BS ISO 22493:2014 | Microbeam analysis. Scanning electron microscopy. Vocabulary |
| ISO/TS 10798:2011 | Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis |
| DIN ISO 15632:2015-11 | Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012) |
| BS ISO 16592:2012 | Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method |
| NF ISO 13067 : 2012 | MICROBEAM ANALYSIS - ELECTRON BACKSCATTER DIFFRACTION - MEASUREMENT OF AVERAGE GRAIN SIZE |
| ISO/TS 10797:2012 | Nanotechnologies — Characterization of single-wall carbon nanotubes using transmission electron microscopy |
| BS ISO 11938:2012 | Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy |
| 11/30199190 DC : 0 | BS ISO 15632 - MICROBEAM ANALYSIS - INSTRUMENTAL PERFORMANCE PARAMETERS FOR THE SPECIFICATION AND CHECKING OF ENERGY-DISPERSIVE X-RAY SPECTROMETERS FOR USE IN ELECTRON PROBE MICROANALYSIS |
| 10/30185165 DC : 0 | BS ISO 11938 - MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - METHODS OF ELEMENTAL AREA ANALYSIS USING WAVELENGTH-DISPERSIVE SPECTROSCOPY |
| 04/30122733 DC : DRAFT SEP 2004 | BS ISO 22309 - MICROBEAM ANALYSIS - QUANTITATIVE ANALYSIS USING ENERGY DISPERSIVE SPECTROMETRY (EDS) |
| BS ISO 13067:2011 | Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size |
| BS ISO 15632:2012 | Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis |
| DIN ISO 16592:2015-12 | MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - GUIDELINES FOR DETERMINING THE CARBON CONTENT OF STEELS USING A CALIBRATION CURVE METHOD (ISO 16592:2012) |
| ISO 22493:2014 | Microbeam analysis — Scanning electron microscopy — Vocabulary |
| DD ISO/TS 10798 : DRAFT JULY 2011 | NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLEWALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS |
| BS ISO 15932:2013 | Microbeam analysis. Analytical electron microscopy. Vocabulary |
| BS ISO 22489:2016 | Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy |
| 17/30328207 DC : DRAFT SEP 2017 | BS ISO 20720 - MICROBEAM ANALYSIS - METHODS OF THE SPECIMEN PREPARATION FOR ANALYSIS OF GENERAL POWDERS USING WDS AND EDS |
| 04/30103951 DC : DRAFT JUN 2004 | |
| DIN ISO 13067:2015-12 | Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011) |
| PD ISO/TS 10797:2012 | Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy |
| ISO 16592:2012 | Microbeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve method |
| ISO 13067:2011 | Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size |
| ISO 15932:2013 | Microbeam analysis — Analytical electron microscopy — Vocabulary |
| ISO 22489:2016 | Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy |
| 16/30296413 DC : 0 | BS ISO 19463 - MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSER (EPMA) - GUIDELINES FOR PERFORMING QUALITY ASSURANCE PROCEDURES |
| 12/30245653 DC : 0 | BS ISO 15932 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - VOCABULARY |
| ISO 11938:2012 | Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy |
| ISO 15632:2012 | Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis |
| ISO 1087-1:2000 | Terminology work — Vocabulary — Part 1: Theory and application |
| ISO 18115-1:2013 | Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy |
| ISO/IEC Guide 99:2007 | International vocabulary of metrology — Basic and general concepts and associated terms (VIM) |
| ISO 18115-2:2013 | Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy |
| ISO 704:2009 | Terminology work — Principles and methods |
| ISO 15632:2012 | Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis |
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