NF EN 60749-11 : 2002
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD
12-01-2013
Foreword
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Describes the rapid change of temperature test method and the two-fluid-bath method. It is applicable to all semiconductor devices.
| DevelopmentNote |
Indice de classement: C96-022-11. (03/2003) Supersedes NF EN 60749. (06/2007)
|
| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-11:2003-04 | Identical |
| BS EN 60749-11:2002 | Identical |
| IEC 60749-11:2002 | Identical |
| EN 60749-11:2002 | Identical |
| UNE-EN 60749-11:2003 | Identical |
| I.S. EN 60749-11:2002 | Identical |
| NF EN 60749-30 : 2005 AMD 1 2011 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING |
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