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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    BS EN 62215-3 - INTEGRATED CIRCUITS - MEASUREMENT OF IMPULSE IMMUNITY - PART 3: NON-SYNCHRONOUS TRANSIENT INJECTION METHOD

    Available format(s):  Hardcopy, PDF

    Superseded date:  31-10-2013

    Language(s):  English

    Published date: 

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 Normative References
    3 Definitions
    4 General
    5 Coupling networks
    6 DUT setup
    7 Test conditions
    8 Test equipment
    9 Test set up
    10 Test procedure
    Annex A (informative) - Test Board Requirements
    Annex B (informative) - Selection hints for coupling
            and decoupling network values
    Annex C (informative) - Industrial and consumer
            applications
    Annex D (informative) - Vehicle applications

    General Product Information - (Show below) - (Hide below)

    Comment Closes On
    Committee EPL/47
    Document Type Draft
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60050-131:2002 International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory
    IEC 61000-4-4 : 3.0EN+(REDLINE+VERSION) ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-4: TESTING AND MEASUREMENT TECHNIQUES - ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST
    ISO 7637-3:2016 Road vehicles — Electrical disturbances from conduction and coupling — Part 3: Electrical transient transmission by capacitive and inductive coupling via lines other than supply lines
    IEC 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
    ISO 7637-2:2011 Road vehicles Electrical disturbances from conduction and coupling Part 2: Electrical transient conduction along supply lines only
    IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
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