13/30278807 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE
Hardcopy , PDF
31-12-2015
English
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FOREWORD
INTRODUCTION
1.Scope
2.Normative references
3.Configuration of enclosures
4.Designation of types
5.Metal enclosure dimensions
6.Lead connections
7.Designation of metal enclosures
Annex A (informative) - Bibliography
BS EN 61837-3
| Committee |
EPL/49
|
| DocumentType |
Draft
|
| Pages |
24
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| IEC 60191-6:2009 | Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages |
| IEC 60122-3:2010 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
| ISO 1101:2017 | Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out |
| IEC 61019-1-2:1993 | Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions |
| IEC 60368-1:2000+AMD1:2004 CSV | Piezoelectric filters of assessed quality - Part 1: Genericspecification |
| IEC 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
| IEC 60368-3:2010 | Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 61240:2016 | Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules |
| IEC 60122-2:1983 | Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection |
| IEC 60862-2:2012 | Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
| IEC 60862-3:2003 | Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines |
| IEC 60368-2-2:1996 | Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters |
| IEC 60679-3:2012 | Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
| IEC 61178-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification |
| IEC 60679-2:1981 | Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators |
| IEC 60368-2-1:1988 | Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters |
| IEC 61019-1-1:1990 | Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values |
| IEC 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
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