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13/30286163 DC : 0

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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BS EN 62435-2 - ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 2 - DETERIORATION MECHANISMS

Available format(s)

Hardcopy , PDF

Superseded date

31-07-2017

Superseded by

BS EN 62435-2:2017

Language(s)

English

€23.37
Excluding VAT

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Principles of deterioration
5 Technical validation of the components
Annex A (Normative)
Annex B (normative) - Failure mechanisms - Encapsulated
        and non-encapsulated active components

BS EN 62435-2.

Committee
EPL/47
DocumentType
Draft
Pages
13
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IEC 61340-5-1:2016 Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
IEC TS 61340-5-2:1999 Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide
IEC TR 62380:2004 Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
IEC TS 61945:2000 Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
EN 190000:1995 Generic Specification: Monolithic integrated circuits

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